Report No. 093161R-RFCEP02V01-A Page: 1 of 46 Test Report Product Name Notebook Model No. MS-1351, X320 Transmitter Module MSI / MS-6896 Applicant MICRO-STAR INT’L Co., LTD. Address No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt Mar. 10, 2009 Issued Date Mar. 26, 2009 Report No. 093161R-RFCEP02V01-A Version V1.0 The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
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The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Report No. 093161R-RFCEP02V01-A
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Test Report Cert i f icat ion Issued Date: Mar. 26, 2009 Report No.: 093161R-RFCEP02V01-A
Applicable Standard ETSI EN 301489-1: V1.6.1 (2005-09)
ETSI EN 301 489-17:V1.2.1 (2002-08)
Test Result Complied
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Documented By :
(Senior Engineering Adm. Specialist / Anita Chou)
Tested By :
( Engineer / Molin Huang )
Approved By :
(Manager / Vincent Lin )
Accredited by DNV, Nemko and NIST (NVLAP)
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TABLE OF CONTENTS Description Page 1. GENERAL INFORMATION.................................................................................................5 1.1. EUT Description......................................................................................................................................5 1.2. Tested System Details..............................................................................................................................7 1.3. Configuration of Test System ..................................................................................................................8 1.4. EUT Exercise Software ...........................................................................................................................8 1.5. Test Facility .............................................................................................................................................9 2. Conducted Emission .............................................................................................................10 2.1. Test Equipmen .......................................................................................................................................10 2.2. Test Setup ..............................................................................................................................................10 2.3. Limits.....................................................................................................................................................11 2.4. Test Procedure .......................................................................................................................................12 2.5. Test Specification ..................................................................................................................................12 2.6. Uncertainty ............................................................................................................................................12 2.7. Test Result .............................................................................................................................................12 3. Radiated Emission ................................................................................................................13 3.1. Test Equipment ......................................................................................................................................13 3.2. Test Setup ..............................................................................................................................................13 3.3. Limits.....................................................................................................................................................14 3.4. Test Procedure .......................................................................................................................................14 3.5. Test Specification ..................................................................................................................................14 3.6. Uncertainty ............................................................................................................................................14 3.7. Test Result .............................................................................................................................................14 4. Power Harmonics, Voltage Fluctuation and Flicker..........................................................15 4.1. Test Equipment ......................................................................................................................................15 4.2. Test Setup ..............................................................................................................................................15 4.3. Limits.....................................................................................................................................................15 4.4. Test Procedure .......................................................................................................................................16 4.5. Test Specification ..................................................................................................................................16 4.6. Uncertainty ............................................................................................................................................16 4.7. Test Result .............................................................................................................................................16 5. Electrostatic Discharge (ESD)..............................................................................................17 5.1. Test Equipment ......................................................................................................................................17 5.2. Test Setup ..............................................................................................................................................17 5.3. Test Level ..............................................................................................................................................17 5.4. Test Procedure .......................................................................................................................................18 5.5. Test Specification ..................................................................................................................................18 5.6. Uncertainty ............................................................................................................................................18 5.7. Test Result .............................................................................................................................................18 6. Radiated Susceptibility (RS) ................................................................................................19 6.1. Test Equipment ......................................................................................................................................19 6.2. Test Setup ..............................................................................................................................................19 6.3. Test Level ..............................................................................................................................................19 6.4. Test Procedure .......................................................................................................................................20 6.5. Test Specification ..................................................................................................................................20 6.6. Uncertainty ............................................................................................................................................20 6.7. Test Result .............................................................................................................................................20 7. Electrical Fast Transient/Burst (EFT/B).............................................................................21 7.1. Test Equipment ......................................................................................................................................21 7.2. Test Setup ..............................................................................................................................................21 7.3. Test Level ..............................................................................................................................................22 7.4. Test Procedure .......................................................................................................................................22
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7.5. Test Specification ..................................................................................................................................22 7.6. Uncertainty ............................................................................................................................................22 7.7. Test Result .............................................................................................................................................22 8. Surge.......................................................................................................................................23 8.1. Test Equipment ......................................................................................................................................23 8.2. Test Setup ..............................................................................................................................................23 8.3. Test Level ..............................................................................................................................................23 8.4. Test Procedure .......................................................................................................................................24 8.5. Test Specification ..................................................................................................................................24 8.6. Uncertainty ............................................................................................................................................24 8.7. Test Result .............................................................................................................................................24 9. Conducted Susceptibility (CS) .............................................................................................25 9.1. Test Equipment ......................................................................................................................................25 9.2. Test Setup ..............................................................................................................................................25 9.3. Test Level ..............................................................................................................................................25 9.4. Test Procedure .......................................................................................................................................26 9.5. Test Specification ..................................................................................................................................26 9.6. Uncertainty ............................................................................................................................................26 9.7. Test Result .............................................................................................................................................26 10. Voltage Dips and Interruption .............................................................................................27 10.1. Test Equipment ......................................................................................................................................27 10.2. Test Setup ..............................................................................................................................................27 10.3. Test Level ..............................................................................................................................................27 10.4. Test Procedure .......................................................................................................................................28 10.5. Test Specification ..................................................................................................................................28 10.6. Uncertainty ............................................................................................................................................28 10.7. Test Result .............................................................................................................................................28 11. EMC Reduction Method During Compliance Testing.......................................................29 12. Test Result..............................................................................................................................30 12.1. Test Data of Conducted Emission..........................................................................................................31 12.2. Test Data of Radiated Emission.............................................................................................................35 12.3. Test Data of Power Harmonics, Voltage Flucturation and Flicker ........................................................36 12.4. Test Data of Electrostatic Discharge......................................................................................................39 12.5. Test Data of Radiated Susceptibility......................................................................................................40 12.6. Test Data of Electrical Fast Transient....................................................................................................41 12.7. Test Data of Surge .................................................................................................................................42 12.8. Test Data of Conducted Susceptibility ..................................................................................................43 12.9. Test Data of Voltage Dips and Interruption ...........................................................................................44
Attachment 1: EUT Test Photographs
Attachment 2: EUT Detailed Photographs
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1. GENERAL INFORMATION
1.1. EUT Description
Product Name Notebook
Trade Name MSI
Model No. MS-1351, X320
EUT Working Voltage AC 100-240V, 50-60Hz
Frequency Range 2412-2472MHz
Number of Channels 802.11b/g/n-20MHz: 13, 802.11n-40MHz: 7
Data Speed (max) 802.11b: 11Mbps, 802.11g: 54Mbps, 802.11n: Up to 300Mbps
Channel separation 5MHz
Type of Modulation DSSS/OFDM
Channel Control Auto
Antenna Gain Refer to the table “Antenna List”
Antenna type PIFA
Power Adapter M/N: DELTA, M/N: ADP-40MH BD
Input: AC 100-240V~1.2A, 50-60Hz
Output: DC 20V, 2.0A
Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded.
Antenna List
No. Manufacturer Part No. Peak Gain
1 Ji-Haw S79-1800G00-J36 (Black/Gray Cable) 2.69 dBi for 2.4GHz
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802.11b/g/n-20MHz Center Frequency of Each Channel (WLAN):
Channel Frequency Channel Frequency Channel Frequency Channel Frequency
Channel Frequency Channel Frequency Channel Frequency Channel Frequency
Channel 1: 2422 MHz Channel 2: 2427 MHz Channel 3: 2432 MHz Channel 4: 2437 MHz Channel 5: 2442 MHz Channel 6: 2447MHz Channel 7: 2452MHz Note: 1. The EUT is including two models, The MS-1351 for MSI and the X320 for different marketing requirement. 2. QuieTek verified the construction and function in typical operation. All the test modes were carried out with
the EUT in normal operation, which was shown in this test report and defined as:
EMI Mode Mode 1: Normal Operation (Adapter: ADP-40MH BD) EMS Mode Mode 1: Normal Operation (Adapter: ADP-40MH BD)
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1.2. Tested System Details
The types for all equipment, plus descriptions of all cables used in the tested system (including inserted cards) are:
Product Manufacturer Model No. Serial No. Power Cord
B D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded.
C Earphone & Microphone Cable Non-Shielded, 1.6m
D USB Cable Shielded, 1.5m
E USB Cable Shielded, 1.5m
F USB Cable Shielded, 1.5m
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1.3. Configuration of Test System
1.4. EUT Exercise Software
(1) Setup the EUT and peripherals as shown in section 1.3.
(2) Turn on the power of all equipments.
(3) Boot the EUT.
(4) The EUT reads test software from the hard disk.
(5) The EUT, the monitor, and the notebook will show the transmitting and receiving characteristics when the
communication is success.
(6) The wireless LAN function is used to perform the wireless data transmission.
(7) Notebook sends "H" character to LCM display and external monitor at the same time, the screen will
display and fill with "H" pattern.
(8) Notebook sends "H" character to printer, the printer will print "H" pattern on paper.
(9) Carry out the function of the EUT cell-phone and platform of simulation base of cell-phone and do the line
(10)Repeat the step 5 and 8.
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1.5. Test Facility
Ambient conditions in the laboratory:
Items Test Item Required (IEC 68-1) Actual
Temperature (C) 15-35 20-35
Humidity (%RH) 30-60 50-55
Barometric pressure (mbar)
IEC 61000-4-2
860-1060 950-1000
Temperature (C) 15-35 20-35
Humidity (%RH) 10-75 50-65
Barometric pressure (mbar)
IEC 61000-4-5
860-1060 950-1000
Temperature (C) 15-35 20-35
Barometric pressure (mbar)
IEC 61000-4-4
IEC 61000-4-11 860-1060 950-1000
The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/
Site Description: Accredited by NVLAP NVLAP Lab Code: 200533-0 Accredited by DNV Statement No. : 413-99-LAB11 Accredited by Nemko Certificate No.: ELA 165 Accredited by TUV Rheinland Certificate No.: 10011438-1-2008 Accredited by TAF Accredited Number: 0914 Site Name: Quietek Corporation Site Address: No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]
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2. Conducted Emission
2.1. Test Equipmen
The following test equipment are used during the conducted emission test:
Item Equipment Manufacturer Model No. / Serial No. Last Cal. Remark
1 Test Receiver R & S ESCS 30 / 825442/018 Sep., 2008
2 Artificial Mains Network R & S ENV4200 / 848411/10 Feb., 2009 Peripherals
3 LISN R & S ESH3-Z5 / 825562/002 Feb., 2009 EUT
4 Pulse Limiter R & S ESH3-Z2 / 357.8810.52 Feb., 2009
5 4-wire ISN R & S ENY41 / 837032/001 Feb., 2009
6 Double 2-Wire ISN R & S ENY22 / 835354/008 Feb., 2009
7 No.1 Shielded Room
Note: All equipments are calibrated every one year.
2.2. Test Setup
Peripheral
80cm
AMN for EUT
Shielded Room
40cm
( EUT )
≧0.8m
AMN for Peripheral
50 ohm Terminator Test Receiver
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2.3. Limits
(1) Mains terminal
Limits (dBuV)
Limit for conducted emissions of
equipment intended to be used in
telecommunication centers only
Limit for conducted emissions Frequency
MHz
QP AV QP AV
0.15 - 0.50 79 66 66-56 56-46
0.50-5.0 73 60 56 46
5.0 - 30 73 60 60 50
Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15
MHz ~ 0.50 MHz.
(2) Telecommunication ports
Limits (dBuV)
Limit for conducted emissions from telecommunication ports of
equipment intended for use in telecommunication centers only
Limit for conducted emissions from telecommunication ports Frequency
MHz
QP AV QP AV
0.15 – 0.50 97-87 84-74 84-74 74-64
5.0 – 30 87 74 74 64
Remarks: In the above table, the tighter limit applies at the band edges.
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2.4. Test Procedure
AC Mains:
The EUT and simulators are connected to the main power through a line impedance stabilization
network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment.
The peripheral devices are also connected to the main power through a LISN that provides a 50ohm
/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test
setup and photographs.)
Both sides of AC line are checked for maximum conducted interference. In order to find the maximum
emission, the relative positions of equipment and all of the interface cables must be changed according
to ETSI EN 301 489-1: V1.6.1 (2005-09) on conducted measurement.
The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the telecommunication port
shall be connected to the ISN, which is 150ohm impedance. Both alternative cables are tested related to
the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement
is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable,
55dB LCL ISN is used for cat. 3.
2.5. Test Specification
According to ETSI EN 301 489-1: V1.6.1 (2005-09)
EN 55022: 2006
2.6. Uncertainty
± 2.26 dB
2.7. Test Result
The emission from the EUT was below the specified limits. The worst-case emissions are shown in
section 12. The EUT complies the acceptance criterion and passes the test.
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3. Radiated Emission
3.1. Test Equipment
The following test equipment are used during the Radiated emission test:
Test Site Equipment Manufacturer Model No./Serial No. Last Cal.
Test Receiver R & S ESVS 10 / 834468/003 July, 2008
Spectrum Analyzer Advantest R3162/ 00803480 May, 2008
Pre-Amplifier Advantest BB525C/ 3307A01812 May, 2008
The EUT is supplied in series with power analyzer from a power source having the same normal
voltage and frequency as the rated supply voltage and the equipment under test. And the rated
voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.
4.5. Test Specification
According to EN 61000-3-2:2006, EN 61000-3-3:1995+A1: 2001+A2: 2005
4.6. Uncertainty
± 3.23 %
4.7. Test Result
The measurement of the power harmonics, which test at the extremes of EUT’s supply range, was
investigated and test result was shown in section 12. The EUT complies the acceptance criterion and
passes the test.
Test Result: (See Test Result)
PASS FAIL
Note: According to clause 7 of EN 61000-3-2: 2000+A2: 2005, equipment with a rated
power of 75W or less, no limits apply. The test result is only for reference.
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5. Electrostatic Discharge (ESD)
5.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 ESD Simulator System SCHAFFNER NSG-438 S/N: 167 June, 2008
2 Horizontal Coupling Plane (HCP)
QuieTek HCP AL50 N/A
3 Vertical Coupling Plane (VCP)
QuieTek VCP AL50 N/A
4 No.3 Shielded Room
Note: All equipments are calibrated every one year.
5.2. Test Setup
5.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge
±4 Contact Discharge B
Metal Ground Plane
ESD Simulator
EUT Loads: Active Insulation
Horizontal Coupling Plane
Non-Conducted table 470K ohm Resistor
470K ohm Resistor
Vertical Coupling Plane
80cm
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5.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge time
between successive single discharges will be keep longer 1 second. It was at least ten single
discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked on the
red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a
distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at least ten
single discharges with positive and negative at the same selected point.
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned vertically
at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling
plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at least ten
single discharges with positive and negative at the same selected point.
5.5. Test Specification
According to EN 61000-4-2 Edition1.2:2001-04
5.6. Uncertainty
± 6.003 %
5.7. Test Result
The measurement of the electrostatic discharge was investigated and test result was shown in section
12. The EUT complies the acceptance criterion and passes the test.
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6. Radiated Susceptibility (RS)
6.1. Test Equipment
Item Equipment Manufacturer Model No. / Serial No. Last Cal.
1 Signal Generator R & S SMY02 / 825454/029 Oct., 2008
2 Power Amplifier A & R 100W10000M7 / A285000010
N/A
3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A
4 Bilog Antenna Chase CBL6112B / 2452 Sep., 2008
5 Power Meter R & S NRVD / 100219 Jan., 2009
6 Directional Coupler A & R DC6180 / 22735 Jan., 2009
7 No.5 EMC Fully Chamber
Note: All equipments are calibrated every one year.
6.2. Test Setup
6.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Enclosure Port
Radio-Frequency
Electromagnetic Field
Amplitude Modulated
MHz
V/m(Un-modulated, rms)
% AM (1kHz)
80-1000
1400-2000
3
80
A
EUT
Sensor
80cm
3 m
1m
Full-Anechoic Chamber
Power Amplifier
Signal Generator
Field Meter
Computer controller
Camera system
Camera Monitor
Antenna Mast
Load
Power Meter
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6.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with
one coincident with the calibration plane such that the distance from antenna to the EUT was 3
meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on
measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test Remarks
1. Field Strength 3 V/m Level 2
2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal
3. Scanning Frequency 80MHz - 1000MHz, 1400MHz - 2000MHz
4 Dwell Time 3 Seconds
5. Frequency step size f : 1%
6. The rate of Swept of Frequency 1.5 x 10-3 decades/s
6.5. Test Specification
According to EN 61000-4-3 Edition 3.0: 2006
6.6. Uncertainty
± 6.17 %
6.7. Test Result
The measurement of the radiated susceptibility was investigated and test result was shown in section
12. The EUT complies the acceptance criterion and passes the test.
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7. Electrical Fast Transient/Burst (EFT/B)
7.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Fast Transient/Burst
Generator
SCHAFFNER NSG 2050
S/N: 200124-031AR
June, 2008
2 No.6 Shielded Room
Note: All equipments are calibrated every one year.
7.2. Test Setup
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7.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Ports for signal lines and control lines
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+0.5
5/50
5
B
Input DC Power Ports
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+0.5
5/50
5
B
Input AC Power Ports
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+1
5/50
5
B
7.4. Test Procedure
The EUT and load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. For Signal Ports and Telecommunication Ports:
The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min.
For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 1m.
7.5. Test Specification
According to EN 61000-4-4:2004
7.6. Uncertainty
± 8.80 %
7.7. Test Result
The measurement of the Electrical Fast Transient/Burst was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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8. Surge
8.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Surge Generator SCHAFFNER NSG 2050
S/N: 200124-031AR
June, 2008
2 No.6 Shielded Room
Note: All equipments are calibrated every one year.
8.2. Test Setup
8.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Telecommunication Ports (See 1) and 2))
Surges
Line to Ground Tr/Th us
kV 1.2/50 (8/20)
1 B
Telecommunication Ports in Telecom Centres (See 1) and 2))
Surges
Line to Ground Tr/Th us
kV 1.2/50 (8/20)
0.5 B
AC Input and AC Output Power Ports
Surges
Line to Line Line to Ground
Tr/Th us kV kV
1.2/50 (8/20) 1 2
B
AC Input and AC Output Power Ports in Telecom Centres
Surges
Line to Line Line to Ground
Tr/Th us kV kV
1.2/50 (8/20) 0.5 1
B
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity
test shall be required.
Surge Generator
EUT Load PC
Non-Conducted Table Non-Conducted Table
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8.4. Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured
1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The
length of power cord between the coupling device and the EUT shall be 2m or less.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) device couples to
the signal and Telecommunication lines of the EUT.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the
peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
8.5. Test Specification
According to EN 61000-4-5 Edition 2.0: 2005
8.6. Uncertainty
± 7.93 %
8.7. Test Result
The measurement of the Surge was investigated and test result was shown in section 12. The EUT
complies the acceptance criterion and passes the test.
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9. Conducted Susceptibility (CS)
9.1. Test Equipment
Item Equipment Manufacturer Model No. / Serial No. Last Cal.
1 CS SYSTEM SCHAFFNER NSG 2070 March, 2009
2 CDN SCHAFFNER CDN M016S / 20822 Dec., 2008
3 CDN SCHAFFNER CDN M016S / 20823 Dec., 2008
4 FIXED PAD SCHAFFNER INA 2070-1 / 2115 N/A
5 EM Clamp KEMZ 801 / 21024 March, 2009
6 No.6 Shielded Room
Note: All equipments are calibrated every one year.
9.2. Test Setup
9.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
AC Input and AC Output & DC Input and DC output Power Ports & Functional Earth Ports
Radio-Frequency
Common Mode.
Amplitude Modulated
MHz
V (rms, Unmodulated)
% AM (1kHz)
Source Impedance
0.15-80
3
80
150
A
Aux equipment
EUT
CDN
RF-Generator
T2
Ground Reference Plane Non-Conducted Table
CDNAux
equipment
T
PA
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9.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table,
EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference
plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for power
supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test Remarks
1. Field Strength 130dBuV(3V) Level 2
2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal
3. Scanning Frequency 0.15MHz – 80MHz
4 Dwell Time 3 Seconds
5. Frequency step size f : 1%
6. The rate of Swept of Frequency 1.5 x 10-3 decades/s
9.5. Test Specification
According to EN 61000-4-6 Edition 2.2: 2006
9.6. Uncertainty
± 6.17 %
9.7. Test Result
The measurement of the Conducted Susceptibility was investigated and test result was shown in
section 12. The EUT complies the acceptance criterion and passes the test.
Report No. 093161R-RFCEP02V01-A
Page: 27 of 46
10. Voltage Dips and Interruption
10.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Voltage Dips Generator SCHAFFNER NSG 2050
S/N: 200124-031AR
June, 2008
2 No.6 Shielded Room
Note: All equipments are calibrated every one year.
10.2. Test Setup
10.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
AC Input and AC Output Power Ports
Voltage Dips % Reduction
ms
30
10 B
Voltage Dips % Reduction
ms
60
100 C
Voltage Interruptions % Reduction
ms
> 95 %
5000 C
Voltage Dips/ Interruptions /Variations Simulator
EUT Load To AC Line
Controller Computer Printer
Non-Conducted Table 80cm
AC Power Line to EUT
Report No. 093161R-RFCEP02V01-A
Page: 28 of 46
10.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m
on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is large
than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the
typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, with a
sequence of three voltage dips with intervals of 10 seconds, for 60% voltage dip of supplied
voltage and duration 100ms with a sequence of three voltage dips with intervals of 10
seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a
sequence of three voltage interruptions with intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900, 1350, 1800, 2250, 2700, 3150 of the
voltage.
10.5. Test Specification
According to EN 61000-4-11 2nd Edition: 2004-03
10.6. Uncertainty
± 2.03 %
10.7. Test Result
The measurement of the Voltage Dips and Interruption was investigated and test result was shown in
section 12. The EUT complies the acceptance criterion and passes the test.
Report No. 093161R-RFCEP02V01-A
Page: 29 of 46
11. EMC Reduction Method During Compliance Testing
No modification was made during testing.
Report No. 093161R-RFCEP02V01-A
Page: 30 of 46
12. Test Result
The test results in the emission and the immunity were performed according to the requirements of
measurement standard and process. Quietek Corporation is assumed full responsibility for the
accuracy and completeness of these measurements. The test data of the emission is listed as below.
All the tests were carried out with the EUT in normal operation, which was defined as:
EMI Mode Mode 1: Normal Operation (Adapter: ADP-40MH BD) EMS Mode Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Report No. 093161R-RFCEP02V01-A
Page: 31 of 46
12.1. Test Data of Conducted Emission
Product : Notebook Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 1 Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
LINE 1
Quasi-Peak
0.193 9.821 45.820 55.641 -9.130 64.771
0.259 9.830 35.070 44.900 -17.986 62.886
0.451 9.820 32.630 42.450 -14.950 57.400
1.154 9.830 23.960 33.790 -22.210 56.000
2.693 9.850 24.410 34.260 -21.740 56.000
5.070 9.870 29.020 38.890 -21.110 60.000
Average
0.193 9.821 39.350 49.171 -5.600 54.771
0.259 9.830 28.080 37.910 -14.976 52.886
0.451 9.820 32.060 41.880 -5.520 47.400
1.154 9.830 23.650 33.480 -12.520 46.000
2.693 9.850 22.930 32.780 -13.220 46.000
5.070 9.870 23.020 32.890 -17.110 50.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
Product : Notebook Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 2 Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
LINE 2
Quasi-Peak
0.189 9.860 43.690 53.550 -11.336 64.886
0.322 9.850 34.530 44.380 -16.706 61.086
0.451 9.833 35.150 44.983 -12.417 57.400
2.439 9.850 23.720 33.570 -22.430 56.000
5.009 9.870 26.510 36.380 -23.620 60.000
25.621 10.290 23.240 33.530 -26.470 60.000
Average
0.189 9.860 36.660 46.520 -8.366 54.886
0.322 9.850 31.620 41.470 -9.616 51.086
0.451 9.833 34.260 44.093 -3.307 47.400
2.439 9.850 20.850 30.700 -15.300 46.000
5.009 9.870 20.000 29.870 -20.130 50.000
25.621 10.290 15.570 25.860 -24.140 50.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as
the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others
the result should be pass.
Report No. 093161R-RFCEP02V01-A
Page: 38 of 46
Product : Notebook Test Item : Voltage Fluctuations and Flicker Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Test Result: Pass Status: Test Completed
Psti and limit line European Limits
0.25
0.50
0.75
1.00
Pst
18:5
3:5
3
Plt and limit line
0.00
0.25
0.50
Plt
18:5
3:5
3
Parameter values recorded during the test: Vrms at the end of test (Volt): 229.50 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.064 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.028 Test limit: 0.650 Pass
Report No. 093161R-RFCEP02V01-A
Page: 39 of 46
12.4. Test Data of Electrostatic Discharge
Product : Notebook Test Item : Electrostatic Discharge Test Site : No.3 Shielded Room Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Item Amount of
Discharge Voltage
Required
Criteria
Complied To Criteria
(A, B, C) Results
Air Discharge 10
10
+2kV, +4kV, +8kV
-2kV, -4kV, -8kV
B
B
A
A
Pass
Pass
Contact Discharge 25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Indirect Discharge
(HCP)
25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Indirect Discharge
(VCP Front)
25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Indirect Discharge
(VCP Left)
25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Indirect Discharge
(VCP Back)
25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Indirect Discharge
(VCP Right)
25
25
+2kV, +4kV
-2kV, -4kV
B
B
A
A
Pass
Pass
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.
Report No. 093161R-RFCEP02V01-A
Page: 40 of 46
12.5. Test Data of Radiated Susceptibility
Product : Notebook Test Item : Radiated Susceptibility Test Site : No.5 EMC fully Chamber Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Frequency (MHz)
Position (Angle)
Polarity(H or V)
Field Strength (V/m)
Required Criteria
Complied To Criteria
(A, B, C) Results
80-1000 Front H 3 A A Pass 80-1000 Front V 3 A A Pass 80-1000 Back H 3 A A Pass 80-1000 Back V 3 A A Pass 80-1000 Left H 3 A A Pass 80-1000 Left V 3 A A Pass 80-1000 Right H 3 A A Pass 80-1000 Right V 3 A A Pass 80-1000 Top H 3 A A Pass 80-1000 Top V 3 A A Pass 80-1000 Down H 3 A A Pass 80-1000 Down V 3 A A Pass
1400-2000 Front H 3 A A Pass 1400-2000 Front V 3 A A Pass 1400-2000 Back H 3 A A Pass 1400-2000 Back V 3 A A Pass 1400-2000 Left H 3 A A Pass 1400-2000 Left V 3 A A Pass 1400-2000 Right H 3 A A Pass 1400-2000 Right V 3 A A Pass 1400-2000 Top H 3 A A Pass 1400-2000 Top V 3 A A Pass 1400-2000 Down H 3 A A Pass 1400-2000 Down V 3 A A Pass
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m
at frequency MHz. No false alarms or other malfunctions were observed during or after the test.
Report No. 093161R-RFCEP02V01-A
Page: 41 of 46
12.6. Test Data of Electrical Fast Transient
Product : Notebook Test Item : Electrical Fast Transient Test Site : No.6 Shielded Room Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line .
No false alarms or other malfunctions were observed during or after the test.
Inject
Line Polarity
Voltage
(kV)
Inject
Time
(Second)
Inject
Method
Required
Criteria
Complied to
Criteria Result
L+N+PE ± 1kV 60 Direct B A PASS
LAN ± 0.5 kV 60 Clamp B A PASS
Report No. 093161R-RFCEP02V01-A
Page: 42 of 46
12.7. Test Data of Surge
Product : Notebook Test Item : Surge Test Site : No. 6 Shielded Room Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Inject
Line Polarity Angle
Voltage
(kV)
Time
Interval
(Second)
Inject
Method
Required
Criteria
Complied to
Criteria Result
L-N ± 0 1 60 Direct B A Pass
L-N ± 90 1 60 Direct B A Pass
L-N ± 180 1 60 Direct B A Pass
L-N ± 270 1 60 Direct B A Pass
N-PE ± 0 2 60 Direct B A Pass
N-PE ± 90 2 60 Direct B A Pass
N-PE ± 180 2 60 Direct B A Pass
N-PE ± 270 2 60 Direct B A Pass
L-PE ± 0 2 60 Direct B A Pass
L-PE ± 90 2 60 Direct B A Pass
L-PE ± 180 2 60 Direct B A Pass
L-PE ± 270 2 60 Direct B A Pass
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line .
No false alarms or other malfunctions were observed during or after the test.
Report No. 093161R-RFCEP02V01-A
Page: 43 of 46
12.8. Test Data of Conducted Susceptibility
Product : Notebook Test Item : Conducted Susceptibility Test Site : No. 6 Shielded Room Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Frequency
Range
(MHz)
Voltage
Applied
dBuV(V)
Inject
Method
Tested Port of
EUT
Required
Criteria
Performance
Criteria
Complied To
Result
0.15~80 130 (3V) CDN AC IN A A PASS
0.15~80 130 (3V) CDN LAN A A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line .
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Report No. 093161R-RFCEP02V01-A
Page: 44 of 46
12.9. Test Data of Voltage Dips and Interruption
Product : Notebook Test Item : Voltage Dips and Interruption Test Site : No.6 Shielded Room Test Mode : Mode 1: Normal Operation (Adapter: ADP-40MH BD)
Voltage Dips and
Interruption Reduction (%)
Angle Test Duration
(ms)
Required Performance
Criteria
Performance Criteria Complied
To
Test Result
30 0 10 B A PASS 30 45 10 B A PASS 30 90 10 B A PASS 30 135 10 B A PASS 30 180 10 B A PASS 30 225 10 B A PASS 30 270 10 B A PASS 30 315 10 B A PASS 60 0 100 B A PASS 60 45 100 B A PASS 60 90 100 B A PASS 60 135 100 B A PASS 60 180 100 B A PASS 60 225 100 B A PASS 60 270 100 B A PASS 60 315 100 B A PASS
>95 0 5000 C B PASS >95 45 5000 C B PASS >95 90 5000 C B PASS >95 135 5000 C B PASS >95 180 5000 C B PASS >95 225 5000 C B PASS >95 270 5000 C B PASS >95 315 5000 C B PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of
Line . No false alarms or other malfunctions were observed during or after the test. The acceptance