Report No: 03CH075E Page:1 of 54 Version:1.0 Test Report Product Name : ICPCON CPU with Converter Model No. : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R, SG-3071, SG-3081, PW-3090-24S, PW-3090-12S, PW-3090-5S, PW-3090-5D, PW-3090- 15D, I-7188E3D-232, I-7188E5D-485, I-7188E3-232, I-7188E5-485, NS-108 Applicant : ICP DAS CO., LTD. Address : No. 111, Kuangfu N. Rd., Hukou Shiang, Hsinchu, Taiwan 303, R.O.C. Date of Receipt : 2003/12/23 Date of Test : 2003/12/23 Report No. : 03CH075E The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
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Report No: 03CH075E
Page:1 of 54 Version:1.0
Test Report
Product Name : ICPCON CPU with Converter
Model No. : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C,
I-7018R, SG-3071, SG-3081, PW-3090-24S,
PW-3090-12S, PW-3090-5S, PW-3090-5D, PW-3090-15D,
I-7188E3D-232, I-7188E5D-485, I-7188E3-232,
I-7188E5-485, NS-108
Applicant : ICP DAS CO., LTD. Address :No. 111, Kuangfu N. Rd., Hukou Shiang, Hsinchu, Taiwan
303, R.O.C.
Date of Receipt : 2003/12/23 Date of Test : 2003/12/23 Report No. : 03CH075E
The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
The following products is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standard as below were applied: The following Equipment:
Product : ICPCON CPU with Converter Trade Name : ICP DAS Model Number : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R,
This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied:
RFI Emission:
EN55022: 1998+A1:2000 Class A : Emission standard
EN 61000-3-2: 2000 Class A
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system
Immunity :
EN 55024:1998+A1: 2001 : Immunity standard
The following importer/manufacturer is responsible for this declaration: Company Name :
Company Address :
Telephone : Facsimile :
Person is responsible for marking this declaration:
Name (Full Name) Position/ Title
Date Legal Signature
QuieTek Corporation / No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel: 886-3-5928858, Fax: 886-3-5928859, E-mail: [email protected]
Date: Dec. 24, 2003 QTK No.: 03CH075E
S t a t e m e n t o f C o n f o r m i t y
The certifies that the following designated product
This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied:
RFI Emission:
EN55022: 1998+A1: 2000 Class B : Emission standard
EN 61000-3-2: 2000 Class A
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system
Immunity :
EN 55024:1998+A1: 2001 : Immunity standard
TEST LABORATORY
Kevin Wang / Vice President
The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
EMC/Safety Test Laboratory Accredited by DNV, TUV, Nemko and NVLAP
Report No: 03CH075E
Page:2 of 54 Version:1.0
Test Repor t Cer t i f icat ion Test Date : 2003/12/23 Report No. : 03CH075E
Product Name : ICPCON CPU with Converter Applicant : ICP DAS CO., LTD. Address : No. 111, Kuangfu N. Rd., Hukou Shiang, Hsinchu, Taiwan 303,
R.O.C. Manufacturer : ICP DAS CO., LTD. Model No. : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R,
Rated Voltage : AC 230 V / 50 Hz Trade Name : ICP DAS Measurement Standard : EN 55022:1998+A1:2000
EN 61000-3-2:2000,EN61000-3-3:1995+A1:2001, EN55024:1998+A1:2001
Measurement Procedure : EN 55022:1998+A1:2000, EN 61000-3-2:2000, EN 61000-3-3:1995+A1:2001, IEC 61000-4-2:1995, IEC 61000-4-3:1995, IEC 61000-4-4:1995, IEC 61000-4-5:1995, IEC 61000-4-6:1996, IEC 61000-4-8:1993, IEC 61000-4-11:1994
Classification : A Test Result : Complied
The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Documented By :
( J o y c e L i n )
Tested By :
( M a t e T s e n g )
Approved By :
( K e v i n W a n g )
Accredited by TUV, DNV, Nemko and NIST (NVLAP)
Report No: 03CH075E
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TABLE OF CONTENTS Description Page 1. General Information........................................................................................................6 1.1. EUT Description ................................................................................................................ 6 1.2. Test Mode.......................................................................................................................... 7 1.3. Tested System Details ...................................................................................................... 7 1.4. Configuration of tested System ........................................................................................ 8 1.5. EUT Exercise Software..................................................................................................... 8 1.6. Test Facility ....................................................................................................................... 9 2. Conducted Emission .................................................................................................... 11 2.1. Test Equipment ................................................................................................................11 2.2. Test Setup ........................................................................................................................11 2.3. Limits ............................................................................................................................... 12 2.4. Test Procedure................................................................................................................ 12 2.5. Test Specification ............................................................................................................ 12 2.6. Test Result ...................................................................................................................... 13 3. Radiated Emission........................................................................................................14 3.1. Test Equipment ............................................................................................................... 14 3.2. Test Setup ....................................................................................................................... 14 3.3. Limits ............................................................................................................................... 15 3.4. Test Procedure................................................................................................................ 15 3.5. Test Specification ............................................................................................................ 15 3.6. Test Result ...................................................................................................................... 16 3.7. Test Photo ....................................................................................................................... 18 4. Power Harmonics..........................................................................................................19 4.1. Test Equipment ............................................................................................................... 19 4.2. Test Setup ....................................................................................................................... 19 4.3. Limits ............................................................................................................................... 20 4.4. Test Procedure................................................................................................................ 21 4.5. Test Specification ............................................................................................................ 21 4.6. Test Result ...................................................................................................................... 22 5. Voltage Fluctuation and Flicker...................................................................................23 5.1. Test Equipment ............................................................................................................... 23 5.2. Test Setup ....................................................................................................................... 23 5.3. Limits ............................................................................................................................... 24 5.4. Test Procedure................................................................................................................ 24 5.5. Test Specification ............................................................................................................ 24 5.6. Test Result ...................................................................................................................... 25 6. Electrostatic Discharge (ESD).....................................................................................26 6.1. Test Equipment ............................................................................................................... 26 6.2. Test Setup ....................................................................................................................... 26 6.3. Limits ............................................................................................................................... 27 6.4. Test Procedure................................................................................................................ 27 6.5. Test Specification ............................................................................................................ 27 6.6. Test Result ...................................................................................................................... 28 6.7. Test Photo ....................................................................................................................... 29
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7. Radiated Susceptibility (RS)........................................................................................30 7.1. Test Equipment ............................................................................................................... 30 7.2. Test Setup ....................................................................................................................... 30 7.3. Limits ............................................................................................................................... 31 7.4. Test Procedure................................................................................................................ 31 7.5. Test Specification ............................................................................................................ 31 7.6. Test Result ...................................................................................................................... 32 7.7. Test Photo ....................................................................................................................... 33 8. Electrical Fast Transient/Burst (EFT/B)......................................................................34 8.1. Test Equipment ............................................................................................................... 34 8.2. Test Setup ....................................................................................................................... 34 8.3. Limits ............................................................................................................................... 35 8.4. Test Procedure................................................................................................................ 35 8.5. Test Specification ............................................................................................................ 35 8.6. Test Result ...................................................................................................................... 36 8.7. Test Photo ....................................................................................................................... 37 9. Surge ..............................................................................................................................38 9.1. Test Equipment ............................................................................................................... 38 9.2. Test Setup ....................................................................................................................... 38 9.3. Limits ............................................................................................................................... 39 9.4. Test Procedure................................................................................................................ 39 9.5. Test Specification ............................................................................................................ 39 9.6. Test Result ...................................................................................................................... 40 9.7. Test Photo ....................................................................................................................... 41 10. Conducted Susceptibility (CS)....................................................................................42 10.1. Test Equipment ............................................................................................................... 42 10.2. Test Setup ....................................................................................................................... 42 10.3. Limits ............................................................................................................................... 43 10.4. Test Procedure................................................................................................................ 43 10.5. Test Specification ............................................................................................................ 43 10.6. Test Result ...................................................................................................................... 44 10.7. Test Photo ....................................................................................................................... 45 11. Power Frequency Magnetic Field................................................................................46 11.1. Test Equipment ............................................................................................................... 46 11.2. Test Setup ....................................................................................................................... 46 11.3. Limits ............................................................................................................................... 47 11.4. Test Procedure................................................................................................................ 47 11.5. Test Specification ............................................................................................................ 47 11.6. Test Result ...................................................................................................................... 48 11.7. Test Photo ....................................................................................................................... 49 12. Voltage Dips and Interruption......................................................................................50 12.1. Test Equipment ............................................................................................................... 50 12.2. Test Setup ....................................................................................................................... 50 12.3. Limits ............................................................................................................................... 51 12.4. Test Procedure................................................................................................................ 51 12.5. Test Specification ............................................................................................................ 51 12.6. Test Result ...................................................................................................................... 52
A VGA Cable Shielded, 1.6m, with one ferrite core bonded B Keyboard Cable Shielded, 1.8m C Mouse Cable Shielded, 1.8m D Printer Cable Shielded, 1.2m E Modem Cable Shielded, 1.5m F Earphone & Microphone Cable Non-Shielded, 1.2m G Earphone & Microphone Cable Non-Shielded, 1.2m H Walkman Cable Non-Shielded, 1.6m I USB Hard Disk Cable Shielded, 1.2m, five PCS. J LAN Cable Non-Shielded, 1.4m, with one ferrite core bonded K USB Cable Shielded, 1.2m, with one ferrite core bonded
1.5. EUT Exercise Software
Test Mode Normal operation 1 Setup the EUT and simulators as shown on 1.3. 2 Turn on the power of all equipment. 3 Boot the PC from Hard Disk. 4 Data will be communicated between computer and EUT. 5 The personal computer monitors’ will show the transmitting and receiving
characteristics when the communication is success. 6 Repeat the above procedure (4) to (5).
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1.6. Test Facility
Ambient conditions in the laboratory:
Items Test Item Required (IEC 68-1) Actual
Temperature (°C) EN55022 CE 15 - 35
Humidity (%RH) 25 - 75
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) EN55022 ISN 15 - 35
Humidity (%RH) 25 - 75
Barometric pressure (mbar) 860 - 1060
Temperature (°C) EN55022 RE 15 - 35 22
Humidity (%RH) 25 - 75 48
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) EN61000-3-2 15 - 35
Humidity (%RH) 25 - 75
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) EN61000-3-3 15 - 35
Humidity (%RH) 25 - 75
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC61000-4-11 15 - 35
Humidity (%RH) 25 - 75
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC61000-4-2 15 - 35 20
Humidity (%RH) 30 - 60 50
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC 61000-4-3 15 - 35 20
Humidity (%RH) 25 - 75 50
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC 61000-4-4 15 - 35 21
Humidity (%RH) 25 - 75 50
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC 61000-4-5 15 - 35 21
Humidity (%RH) 10 - 75 50
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC 61000-4-6 15 - 35 20
Humidity (%RH) 25 - 75 50
Barometric pressure (mbar) 860 - 1060 950-1000
Temperature (°C) IEC 61000-4-8 15 - 35 20
Humidity (%RH) 25 - 75 50
Barometric pressure (mbar) 860 - 1060 950-1000
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Site Description:
September 30, 2003 Accreditation on NVLAP
NVLAP Lab Code: 200347-0
February 23, 1999 Accreditation on DNV
Statement No. : 413-99-LAB11
January 04, 1999 Accreditation on TUV Rheinland
Certificate No.: I9865712-9901
October 08, 2003 Accreditation on Nemko
Certificate No.: ELA 165
Site Name: Quietek Corporation
Site Address: No.75-1, Wang-Yeh Valley, Yung-Hsing,
The following test equipment are used during the test:
Item Equipment Manufacturer Model No. / Serial No. Last Cal. Remark
1 Test Receiver R & S ESCS 30/825442/018 Sep.,2003
2 Artificial Mains Network R & S ENV4200/848411/10 Feb.,2003 Peripherals
3 LISN R & S ESH3-Z5/825562/002 Feb.,2003 EUT
4 Pulse Limiter R & S ESH3-Z2/357.8810.52 Feb.,2003
5 No.2 Shielded Room N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
2.2. Test Setup
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2.3. Limits
EN 55022 Limits (dBuV)
Class A Class B Frequency
MHz QP AV QP AV
0.15 - 0.50 79 66 66-56 56-46
0.50-5.0 73 60 56 46
5.0 - 30 73 60 60 50
Remarks : In the above table, the tighter limit applies at the band edges.
2.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power
through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find
the maximum emission, the relative positions of equipment and all of the interface cables
must be changed according to EN 55022: 1998+A1: 2000 on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz
using a receiver bandwidth of 9kHz.
2.5. Test Specification
According to EN 55022: 1998+A1: 2000
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2.6. Test Result
Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR2 Test Condition Line1 Test Range 0.15~30MHz
Owing to the DC operation of EUT, this test item is not performed.
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3. Radiated Emission
3.1. Test Equipment
The following test equipment are used during the test:
Item Equipment Manufacturer Model No. / Serial No. Last Cal.
1 X Test Receiver R & S ESCS 30 / 836858/023 Jan.,2003
2 X Spectrum Analyzer Advantest R3261C / 81720471 N/A
3 X Pre-Amplifier QuieTek QTK-AMP / AMP1 N/A
4 X Bilog Antenna Chase CBL6112B / 2708 Sep.,2003
5 No.2 OATS Sep.,2003
Note: 1. All equipments that need to calibrate are with calibration period of 1 year. 2. Mark “X” test instruments are used to measure the final test results.
3.2. Test Setup
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3.3. Limits
EN 55022 Limits (dBuV/m)
Class A Class B Frequency
MHz Distance
(m) dBuV/m Distance
(m) dBuV/m
30 – 230 10 40 10 30
230 – 1000 10 47 10 37
Remark: 1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring
instrument antenna and the closed point of any part of the device or
system.
3. RF Voltage (dBuV/m) = 20 log RF Voltage (uV/m)
3.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground.
The turn table can rotate 360 degrees to determine the position of the maximum emission
level. The EUT was positioned such that the distance from antenna to the EUT was 10
meters.
The antenna can move up and down between 1 meter and 4 meters to find out the
maximum emission level.
All cable leaving the table-top EUT for a connection outsidethe test site (for example, mains
cable, telephone lines, connections to auxiliary equipment located outside the test area) shall
be fitted with ferrite clamps placed on the floor at the point where the cable reached the floor.
Both horizontal and vertical polarization of the antenna are set on measurement. In order
to find the maximum emission, all of the interface cables must be manipulated according
to EN 55022: 1998+A1: 2000 on radiated measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of
10 meters.
3.5. Test Specification
According to EN 55022: 1998+A1: 2000
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3.6. Test Result
Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site Site2 Test Condition Horizontal Test Range 30~1000MHz
Frequency Cable Probe PreAMP Reading Emission Margin Limit