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Automation of RGAs and Sensors for FDC of PVD Metal Thin Film Processing
Arif Choudhury1, Eric McCormick1, Guy Takayesu1, Keith Han3, Alex Lee3, Young Hwan Lee3, Justin Wong2, and John Yoo2
1TriQuint Semiconductor Corporation, 500 W Renner Rd, Richardson, Texas, USA 750802BISTel America, 4633 Old Ironsides Dr, Suite 300, Santa Clara, CA 950543BISTel Inc. 2F, Jeongpung Bldg, 1341-3 Seocho-dong, Seocho-gu, Seoul, Korea 137-070
Content
• Introduction– RGA Usage In PVD Process
• Applications of RGA in Manufacturing• Architecture of FDC and Sensors• RGA Filament Control Schemes• Examples of FDC with RGA• Future Work• Conclusion
• The RGA is commonly used to identify atomic and molecular species in a high vacuum environment.
• In the PVD process the RGA is commonly used to monitor contamination before and during the process.– Screens the incoming substrate for resist residue– Monitoring process gases
• The RGA is very sensitive, it can detect low pressure contaminants in 10-14 Torr
Having one system that can connect to multiple components and interdict in the event of an incident saves the expense of having multiple FDC systems for each component Adding RGAs from different manufacturers that are not supported by the tool OEMs.
• RGA operation constraint– Open Ion Source mode of RGA operation– RGA operating pressure region is limited– Filament tripped off when P > 9.0 x 10-3Torr
• Customized RGA filament control schemes– P < 9.0 x 10-3Torr, filament is always on– P > 9.0 x 10-3Torr, filament on only for a short
time (10sec.) at end of wafer process, otherwise filament is off
• There is great value in integrating RGAs and other sensors into an in-house FDC system.– Sensor Control– Real time context with existing tool parameters– Real time detection
• The authors want to express their appreciations for the valuable inputs on this project from Romek Bobkowski and Richard Groom, both of TriQuint Semiconductor Corporation on PVD processing and RGA operation respectively.