Time Resolving Characteristics of HPK and FBK Silicon ... › event › 759 › contributions › ... · Materials (MIDEM 2008), Fiesa - Slovenia, 17-19 September 2008 pp.11-22. ISBN
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Time Resolving Characteristics of HPK and FBK Silicon Photomultipliers for TOF and PET
ApplicationsG. Ambrosi, P. Azzarello, R. Battiston, G. Di Loren zo*, M. Ionica, and G.U. Pignatel*
INFN – Sez. Perugia – via Pascoli 1, 06123 Perugia*DIEI – Dip. Ingegneria Elettronica e dell’Informazio ne, via G.Duranti 93, 06125 Perugia
AbstractIn Time-of-flight measurements, or Positron Emission Tomography experiments where two gamma rays are emitted in coincidence, the time resolution of the photodetector is of primary importance.
SiPMs are very promising devices for these applications, since their intrinsic response time can be very short, even less than 1 ns. However the actual timing resolution of SiPM is affected by the area
(capacitance) of the device, by the type of electronics used to pre-amplify the signal, by the Dark count rate which is detected as pure noise, and other second order effects like cross-talk and after dark
pulsing.In this work we report the characteristics of different samples of HPK
(Hamamatsu Photonics) and FBK (Fondazione Bruno Kessler) SiPM,
with the pixel size ranging from 40 to 100 micron. In particular, we have
investigated their time response when stimulated with O(100) ps pulsed
laser with wavelength in the range 400-800 nm. SiPM performances are
also compared with that of fast PIN diodes characterized with the same
set-up.
Spectral measurement
Pedestal
2 pixel
1 pixel
References
Cou
nts
Vbias
� VI labview: multichannel automatic acquisition to determine
dark count rate and breakdown voltage of devices.
� VI Labview realized for direct data acquisition from
oscilloscope.
� 407nm and 783nm pulsed laser head as Low Light
Level (LLL) sources for spectral characterization.
� Comparative characterization obtained with SiPMs
placed at three different distances from light source.
� Noise spectrum obtained by acquiring the SiPM
dark signal to identify the one pixel dark count rate
and the measurement system noise.
Background
Linearity
Spectrum
Multi peak
gaussian fit
�The oscilloscope is an Agilent infiniium 54831D with delta
time measure (two channel measure).
�The signal source is a PICOQUANT pulsed laser diode driver
PDL 800-B with heads of 407nm and 783nm.
� the trigger signal is the laser driver sinchronization output.
�Time resolution values obtained like standard deviation of the
gaussian fit.
�Counts-voltage characteristic obtained with program-
mable leading edge discriminator, as an alternative method
to identify the breakdown voltage and choose the optimum
operating overvoltage.
�Example of result of acquisition: dark count rate
characteristics for different overvoltages
discriminator threshold
� Example of single photon spectrum obtained
with a HPK 1mmx1mm 400 pixels@40um SiPM.
� Preamp is an PHOTONIQUE 0604 with gain
18dB@9V.
� Obtained values also fitted with iperbolic
function to verify the correct trend with
distance.
Cou
nts
� Single photon spectra elaborated to
determine the mean value of detected
photons, the testing sistem linearity and the
excess noise factor (ENF).
� Example of FBK irst 1mmx1mm 400pixels@40um single photon spectrum at three
different distances from source.
σσσσ=98ps σσσσ=97ps
� Hamamatsu
HPK 1mmx1mm
� FBK irst 1mmx1mm � FBK irst PIN Diode
(783nm laser)
� The tested SiPMs exhibit energy and time resolution suitable for PET and Fiber particle tracking applications.
� SiPM time resolution is in the range 40-120ps
� Photon resolution is also very good: SiPM are capable to resolve from 1 to a few photons.
� As far as the noise characterization is concerned, we have found that the Counts-Voltage characteristic is a very
effective method to identify the breakdown voltage and to monitoring the dark count rate.
σσσσ=1.328ns
Conclusions�jp.hamamatsu.com
�www.fbk.eu
�G.U.Pignatel “Silicon Photomultiplier: a novel type of photo-detector with single Photon detection capability”
on behalf of the INFN-DASIPM collaboration, 44th International Conference on Microelectronics, Devices and
Materials (MIDEM 2008), Fiesa - Slovenia, 17-19 September 2008 pp.11-22. ISBN 978-961-91023-7-4
�Claudio Piemonte “A new Silicon Photomultiplier structure for blue light detection”, NIM-A 568 (2006) 224
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