Latest Advances in Spectroradiometric Measurement Systems for Night Vision Compatible Displays Latest Advances in Spectroradiometric Measurement Systems.
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Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Latest Advances in Latest Advances in Spectroradiometric Measurement Spectroradiometric Measurement
Systems for Systems for Night Vision Compatible DisplaysNight Vision Compatible Displays
Latest Advances in Latest Advances in Spectroradiometric Measurement Spectroradiometric Measurement
Systems for Systems for Night Vision Compatible DisplaysNight Vision Compatible Displays
Optronic Laboratories, Inc.Optronic Laboratories, Inc.Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Make It Easy to Meet and Exceed the Make It Easy to Meet and Exceed the Requirements of MIL-L-85762A StandardRequirements of MIL-L-85762A Standard
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Outline of PresentationOutline of PresentationOutline of PresentationOutline of Presentation
About Optronic Laboratories, Inc.About Optronic Laboratories, Inc. Introduction to the OL 750-NVGIntroduction to the OL 750-NVG Practical aspects of measurementPractical aspects of measurement Key MIL-L-85762A requirements and OL Key MIL-L-85762A requirements and OL
750-NVG performance750-NVG performance Essential performance beyond MIL-L-Essential performance beyond MIL-L-
85762A85762A Special featuresSpecial features
About Optronic Laboratories, Inc.About Optronic Laboratories, Inc. Introduction to the OL 750-NVGIntroduction to the OL 750-NVG Practical aspects of measurementPractical aspects of measurement Key MIL-L-85762A requirements and OL Key MIL-L-85762A requirements and OL
750-NVG performance750-NVG performance Essential performance beyond MIL-L-Essential performance beyond MIL-L-
85762A85762A Special featuresSpecial features
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
About Optronic About Optronic Laboratories, Inc.Laboratories, Inc.About Optronic About Optronic
Laboratories, Inc.Laboratories, Inc.Optronic Laboratories, Inc. was established in 1970 Optronic Laboratories, Inc. was established in 1970
by two eminent researchers at NIST (then NBS). by two eminent researchers at NIST (then NBS). Facilities were modeled after NIST, and Optronic Facilities were modeled after NIST, and Optronic
Laboratories, Inc. achieved a worldwide reputation Laboratories, Inc. achieved a worldwide reputation for excellence in light measurement and calibration.for excellence in light measurement and calibration.
Continuing to work closely with NIST, the Continuing to work closely with NIST, the development of new instruments and techniques at development of new instruments and techniques at Optronic Laboratories, Inc. constantly improves the Optronic Laboratories, Inc. constantly improves the
accuracy and precision of light measurement.accuracy and precision of light measurement.
Optronic Laboratories, Inc. was established in 1970 Optronic Laboratories, Inc. was established in 1970 by two eminent researchers at NIST (then NBS). by two eminent researchers at NIST (then NBS). Facilities were modeled after NIST, and Optronic Facilities were modeled after NIST, and Optronic
Laboratories, Inc. achieved a worldwide reputation Laboratories, Inc. achieved a worldwide reputation for excellence in light measurement and calibration.for excellence in light measurement and calibration.
Continuing to work closely with NIST, the Continuing to work closely with NIST, the development of new instruments and techniques at development of new instruments and techniques at Optronic Laboratories, Inc. constantly improves the Optronic Laboratories, Inc. constantly improves the
accuracy and precision of light measurement.accuracy and precision of light measurement.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
About Optronic About Optronic Laboratories, Inc.Laboratories, Inc.About Optronic About Optronic
Laboratories, Inc.Laboratories, Inc.
In 1998, Optronic Laboratories, Inc. moved In 1998, Optronic Laboratories, Inc. moved into its new 25,000 square foot purpose-built into its new 25,000 square foot purpose-built
facility, consolidating and expanding facility, consolidating and expanding production, R & D and calibration facilities.production, R & D and calibration facilities.
In 1998, Optronic Laboratories, Inc. moved In 1998, Optronic Laboratories, Inc. moved into its new 25,000 square foot purpose-built into its new 25,000 square foot purpose-built
facility, consolidating and expanding facility, consolidating and expanding production, R & D and calibration facilities.production, R & D and calibration facilities.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Spectroradiometers:Spectroradiometers: laboratory & field portablelaboratory & field portable
Spectroradiometers:Spectroradiometers: laboratory & field portablelaboratory & field portable
Broad-band radiometers & Broad-band radiometers & photometers:photometers: DC, AC, pulsed or modulated sourcesDC, AC, pulsed or modulated sources
Broad-band radiometers & Broad-band radiometers & photometers:photometers: DC, AC, pulsed or modulated sourcesDC, AC, pulsed or modulated sources
Sphere systems:Sphere systems: from 1” to 76” diameter as standardfrom 1” to 76” diameter as standard
Sphere systems:Sphere systems: from 1” to 76” diameter as standardfrom 1” to 76” diameter as standard
NIST-traceable calibration sources, NIST-traceable calibration sources, materials & detectors:materials & detectors: from 200 nm to 30,000 nmfrom 200 nm to 30,000 nm
NIST-traceable calibration sources, NIST-traceable calibration sources, materials & detectors:materials & detectors: from 200 nm to 30,000 nmfrom 200 nm to 30,000 nm
Measurement services:Measurement services: sources, materials & detectorssources, materials & detectors
Measurement services:Measurement services: sources, materials & detectorssources, materials & detectors
Customization/new product Customization/new product developmentdevelopment
Customization/new product Customization/new product developmentdevelopment
Training, consultation & advice Training, consultation & advice Training, consultation & advice Training, consultation & advice
About Optronic About Optronic Laboratories, Inc.Laboratories, Inc.About Optronic About Optronic
Laboratories, Inc.Laboratories, Inc.Optronic Laboratories’ instruments & Optronic Laboratories’ instruments & services include:services include:
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to the OL Introduction to the OL 750-NVG750-NVG
Introduction to the OL Introduction to the OL 750-NVG750-NVG
The OL 750-NVG measures NVIS compatible displays to MIL-L-85762A with unequaled accuracy and performanceThe OL 750-NVG measures NVIS compatible displays to MIL-L-85762A with unequaled accuracy and performance
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
The OL 750-NVG comprises: A specially configured
OL 750 monochromator
A specially configured
OL 750 monochromator
The OL 600-NVG Telescope
The OL 600-NVG Telescope
A special high-sensitivity low-noise GaAs PMT
A special high-sensitivity low-noise GaAs PMT
Temperature regulation for stability
Temperature regulation for stability
Digital Signal Processing (DSP) for best results
Digital Signal Processing (DSP) for best results
Powerful software with dedicated NVIS routinesPowerful software with
dedicated NVIS routines
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
The OL 750-NVG comprises:
Now for a closer look at the special OL 750
monochromator configuration:
Specifically for NVIS measurements
Now for a closer look at the special OL 750
monochromator configuration:
Specifically for NVIS measurements
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
Introduction to theIntroduction to theOL 750-NVGOL 750-NVG
The OL 750-NVG comprises:Fully automatic ND filter wheel
for highest dynamic range
Fully automatic ND filter wheel
for highest dynamic range
Depolarizer for accurate results even on LCD
displays
Depolarizer for accurate results even on LCD
displays
Blocking filters optimized for
lowest stray light
Blocking filters optimized for
lowest stray light
Multiple gratings for optimum response
Multiple gratings for optimum response
Choice of single or double
monochromator
Choice of single or double
monochromator
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
The OL 600-NVG is ideal for display measurements because it uses a “Pritchard” design. The parallax and alignment
errors of other designs are eliminated completely.
The OL 600-NVG is ideal for display measurements because it uses a “Pritchard” design. The parallax and alignment
errors of other designs are eliminated completely.
Here is how it works
Here is how it works
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
DisplayDisplay
Image appears with a “missing”
circular area
Image appears with a “missing”
circular areaThe “missing” portion is sent to the detector
The “missing” portion is sent to the detector
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
Introduction to theIntroduction to theOL 600-NVGOL 600-NVG
Diffraction-limited Diffraction-limited optics ensure the optics ensure the sharpest, clearest sharpest, clearest images are seenimages are seen
Multiple apertures Multiple apertures for optimum field-for optimum field-of-viewof-view
Photometer option Photometer option availableavailable
Diffraction-limited Diffraction-limited optics ensure the optics ensure the sharpest, clearest sharpest, clearest images are seenimages are seen
Multiple apertures Multiple apertures for optimum field-for optimum field-of-viewof-view
Photometer option Photometer option availableavailable
Diffraction- limited opticsDiffraction-
limited optics
Eyepiece is actually a high quality microscope
for best viewing
Eyepiece is actually a high quality microscope
for best viewing
Selectable apertures
Selectable apertures
Measurement area can be sent to OL 750-NVG or photometer
without re-alignment
Measurement area can be sent to OL 750-NVG or photometer
without re-alignment
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Practical Aspects of Practical Aspects of MeasurementMeasurement
Practical Aspects of Practical Aspects of MeasurementMeasurement
The first stage in testing is to isolate the part of The first stage in testing is to isolate the part of the display to be measured.the display to be measured.This is a lot easier if the user sees a magnified This is a lot easier if the user sees a magnified image of the display.image of the display.
The first stage in testing is to isolate the part of The first stage in testing is to isolate the part of the display to be measured.the display to be measured.This is a lot easier if the user sees a magnified This is a lot easier if the user sees a magnified image of the display.image of the display.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
The OL 600-NVG presents a magnified image which The OL 600-NVG presents a magnified image which makes alignment easy and reduces eye-strain. The makes alignment easy and reduces eye-strain. The “spot” being measured appears as a black circle on “spot” being measured appears as a black circle on the image.the image.
The OL 600-NVG presents a magnified image which The OL 600-NVG presents a magnified image which makes alignment easy and reduces eye-strain. The makes alignment easy and reduces eye-strain. The “spot” being measured appears as a black circle on “spot” being measured appears as a black circle on the image.the image.
This black circle is no more than the image This black circle is no more than the image of an aperture, which can be changed to suit of an aperture, which can be changed to suit measurements.measurements.
This black circle is no more than the image This black circle is no more than the image of an aperture, which can be changed to suit of an aperture, which can be changed to suit measurements.measurements.
Practical Aspects of Practical Aspects of MeasurementMeasurement
Practical Aspects of Practical Aspects of MeasurementMeasurement
Anything within the
black circle is measured
Anything within the
black circle is measured
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
The OL 600-NVG has 5 selectable apertures The OL 600-NVG has 5 selectable apertures to provide the optimum spot sizes for all to provide the optimum spot sizes for all NVIS displays. These are:NVIS displays. These are:
The OL 600-NVG has 5 selectable apertures The OL 600-NVG has 5 selectable apertures to provide the optimum spot sizes for all to provide the optimum spot sizes for all NVIS displays. These are:NVIS displays. These are:
0.18 mm(0.007”)0.18 mm(0.007”)0.30 mm(0.012”)0.30 mm(0.012”)0.60 mm(0.024”)0.60 mm(0.024”)1.80 mm(0.07”)
1.80 mm(0.07”)
3.00 mm(0.12”)
3.00 mm(0.12”)
Practical Aspects of Practical Aspects of MeasurementMeasurement
Practical Aspects of Practical Aspects of MeasurementMeasurement
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
MIL-L-85762A specifies performance of MIL-L-85762A specifies performance of NVIS compatible displays, but the NVIS compatible displays, but the equipment used in testing conformance equipment used in testing conformance must also meet specifications.must also meet specifications.
Testing equipment must meet ALL of the Testing equipment must meet ALL of the specifications.specifications.
Some of these specifications are trivial for Some of these specifications are trivial for modern instruments, but others require modern instruments, but others require special innovations to give conformance.special innovations to give conformance.
MIL-L-85762A specifies performance of MIL-L-85762A specifies performance of NVIS compatible displays, but the NVIS compatible displays, but the equipment used in testing conformance equipment used in testing conformance must also meet specifications.must also meet specifications.
Testing equipment must meet ALL of the Testing equipment must meet ALL of the specifications.specifications.
Some of these specifications are trivial for Some of these specifications are trivial for modern instruments, but others require modern instruments, but others require special innovations to give conformance.special innovations to give conformance.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
Testing of NVIS Testing of NVIS compatible compatible
displays to MIL-L-displays to MIL-L-85762A is an 85762A is an
absoluteabsolute requirement for requirement for the USA and is the USA and is
generally adopted generally adopted worldwide. Testing worldwide. Testing
equipment is equipment is specified in specified in Appendix B.Appendix B.
Testing of NVIS Testing of NVIS compatible compatible
displays to MIL-L-displays to MIL-L-85762A is an 85762A is an
absoluteabsolute requirement for requirement for the USA and is the USA and is
generally adopted generally adopted worldwide. Testing worldwide. Testing
equipment is equipment is specified in specified in Appendix B.Appendix B.
APPENDIX B
SPECTRAL RADIANCE, LUMINANCE, AND ILLUMINANCE MEASURING
EQUIPMENT
B10. SCOPE
B10.1 Scope. This appendix details the requirements of the chromaticity, spectral radiance, luminance, and illuminance measurement equipment to be used when performing measurements in accordance with this specification. This Appendix is a mandatory part of this specification. The information contained herein is intended for compliance.
APPENDIX B
SPECTRAL RADIANCE, LUMINANCE, AND ILLUMINANCE MEASURING
EQUIPMENT
B10. SCOPE
B10.1 Scope. This appendix details the requirements of the chromaticity, spectral radiance, luminance, and illuminance measurement equipment to be used when performing measurements in accordance with this specification. This Appendix is a mandatory part of this specification. The information contained herein is intended for compliance.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
MIL-L-85762A Appendix B covers the MIL-L-85762A Appendix B covers the requirements of the testing system and requirements of the testing system and calculationscalculations
Appendix Appendix B40B40 covers covers PhotopicPhotopic testing testing equipment equipment
Appendix Appendix B30B30 covers covers spectroradiometricspectroradiometric testing equipmenttesting equipment
MIL-L-85762A Appendix B covers the MIL-L-85762A Appendix B covers the requirements of the testing system and requirements of the testing system and calculationscalculations
Appendix Appendix B40B40 covers covers PhotopicPhotopic testing testing equipment equipment
Appendix Appendix B30B30 covers covers spectroradiometricspectroradiometric testing equipmenttesting equipment
The OL 750-NVG passesALL requirements
of B30 and B40
The OL 750-NVG passesALL requirements
of B30 and B40
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
To demonstrate To demonstrate conformance, the following conformance, the following
slides will show key slides will show key individual requirements with individual requirements with
actual OL 750-NVG actual OL 750-NVG performance.performance.
To demonstrate To demonstrate conformance, the following conformance, the following
slides will show key slides will show key individual requirements with individual requirements with
actual OL 750-NVG actual OL 750-NVG performance.performance.
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
GeneralGeneral
B30. SPECTRORADIOMETER
B30.1 Chromaticity and spectral radiance measurement equipment. Chromaticity and spectral radiance measurements shall be made using a spectroradiometer meeting the requirements herein. The following calibrations and checks shall be performed within the time period specified in order to assure that the spectroradiometer meets the requirements of this specification. Records of how the spectroradiometer calibration was performed, when performed and the standard lamp used shall be maintained by the contractor and shall be available for government inspection.
B30. SPECTRORADIOMETER
B30.1 Chromaticity and spectral radiance measurement equipment. Chromaticity and spectral radiance measurements shall be made using a spectroradiometer meeting the requirements herein. The following calibrations and checks shall be performed within the time period specified in order to assure that the spectroradiometer meets the requirements of this specification. Records of how the spectroradiometer calibration was performed, when performed and the standard lamp used shall be maintained by the contractor and shall be available for government inspection.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
A spectro-A spectro-radiometer radiometer mustmust be used be used for for chromaticity chromaticity and spectral and spectral radiance radiance measurementsmeasurements
A spectro-A spectro-radiometer radiometer mustmust be used be used for for chromaticity chromaticity and spectral and spectral radiance radiance measurementsmeasurements
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
SensitivitySensitivity
MIL-L-85762A SPECIFICATIONB30.2 Spectroradiometer sensitivity.
Wavelength Radiance level380 to 600 nm 1.0 x 10-10 W/cm² sr nm600 to 900 nm 1.7 x 10-11 W/cm² sr nm900 to 930 nm 1.0 x 10-10 W/cm² sr nm
B30.2.1 Spectroradiometer sensitivity calibration shall be performed within six months (or more frequently if required to insure the spectroradiometer meets the requirements specified herein) prior to taking a measurement. This calibration shall be traceable to NBS standards. The calibrations shall be performed over the wavelength band and at intervals consistent with the measurements to be made. The calibration shall demonstrate that the spectroradiometer meets the sensitivity requirements of B30.2. A separate calibration must be performed for each set of optics used, or when filters are used in front of the spectroradiometer.
MIL-L-85762A SPECIFICATIONB30.2 Spectroradiometer sensitivity.
Wavelength Radiance level380 to 600 nm 1.0 x 10-10 W/cm² sr nm600 to 900 nm 1.7 x 10-11 W/cm² sr nm900 to 930 nm 1.0 x 10-10 W/cm² sr nm
B30.2.1 Spectroradiometer sensitivity calibration shall be performed within six months (or more frequently if required to insure the spectroradiometer meets the requirements specified herein) prior to taking a measurement. This calibration shall be traceable to NBS standards. The calibrations shall be performed over the wavelength band and at intervals consistent with the measurements to be made. The calibration shall demonstrate that the spectroradiometer meets the sensitivity requirements of B30.2. A separate calibration must be performed for each set of optics used, or when filters are used in front of the spectroradiometer.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
MIL-L-85762A Appendix B30.2 sensitivity for OL 750S-NVG
1.00E-14
1.00E-13
1.00E-12
1.00E-11
1.00E-10
1.00E-09
350 400 450 500 550 600 650 700 750 800 850 900 950
Wavelength [nm]
10:1
RM
S s
ensi
tivi
ty [
W/(
cm²
nm
)]
0.178 mm
0.3 mm
0.67 mm
1.67 mm
3 mm
MIL spec
Spot Diameter
MIL-L-85762A Appendix B30.2 sensitivity for OL 750S-NVG
1.00E-14
1.00E-13
1.00E-12
1.00E-11
1.00E-10
1.00E-09
350 400 450 500 550 600 650 700 750 800 850 900 950
Wavelength [nm]
10:1
RM
S s
ensi
tivi
ty [
W/(
cm²
nm
)]
0.178 mm
0.3 mm
0.67 mm
1.67 mm
3 mm
MIL spec
Spot Diameter
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
LinearityLinearity
B30.6 Linearity.Within any given measurement scale, the linearity shall be ±1% of the full scale value. The linearity between any two measurement scales shall be ± 2%.B30.6.1 Linearity verificationThe linearity of the spectroradiometer shall be verified within 6 months prior to taking a measurement. A linearity check shall be performed on each detector used during the test procedures. The spectroradiometer operational parameters shall not be varied during the linearity test. The linearity check shall be performed at a specific wavelength (to be determined by the contractor) which shall not be varied during the linearity test. A light source which can be precisely, mechanically or optically varied in intensity shall be used for the linearity check. Acceptable methods that may be used to vary the intensity of the light source include the use of neutral density filters (with known transmission), precision apertures, superposition, or the inverse square law (provided the distance between the lamp and spectroradiometer can be precisely controlled using a photometric type bench). Dimming of the lamp through electronic means is unacceptable. The intensity of the lamp shall be adjusted to give a full scale reading on the lowest level of dynamic range of the spectroradiometer. Call the lamp output N and the reading on the spectroradiometer R. The intensity of the lamp shall be varied in accordance with the table below, and, in order to pass the linearity check the output of the spectroradiometer, over its entire dynamic range (as applicable) shall be within the limits shown below.
Lamp Output Spectroradiometer Output Lamp Output Spectroradiometer Output0.1N 0.1R ± .01R 100 N 100 R ± 2.0 R0.5 N 0.5 R ± .01 R 500 N 500 R ± 20 R5 N 5.0 R ± 0.2 R 1000 N 1000 R ± 20 R10 N 10 R ± 0.2 R 5000 N 5000 R ± 200 R50 N 50 R ± 2.0 R 10000 N 10000 R ± 200 R
B30.6 Linearity.Within any given measurement scale, the linearity shall be ±1% of the full scale value. The linearity between any two measurement scales shall be ± 2%.B30.6.1 Linearity verificationThe linearity of the spectroradiometer shall be verified within 6 months prior to taking a measurement. A linearity check shall be performed on each detector used during the test procedures. The spectroradiometer operational parameters shall not be varied during the linearity test. The linearity check shall be performed at a specific wavelength (to be determined by the contractor) which shall not be varied during the linearity test. A light source which can be precisely, mechanically or optically varied in intensity shall be used for the linearity check. Acceptable methods that may be used to vary the intensity of the light source include the use of neutral density filters (with known transmission), precision apertures, superposition, or the inverse square law (provided the distance between the lamp and spectroradiometer can be precisely controlled using a photometric type bench). Dimming of the lamp through electronic means is unacceptable. The intensity of the lamp shall be adjusted to give a full scale reading on the lowest level of dynamic range of the spectroradiometer. Call the lamp output N and the reading on the spectroradiometer R. The intensity of the lamp shall be varied in accordance with the table below, and, in order to pass the linearity check the output of the spectroradiometer, over its entire dynamic range (as applicable) shall be within the limits shown below.
Lamp Output Spectroradiometer Output Lamp Output Spectroradiometer Output0.1N 0.1R ± .01R 100 N 100 R ± 2.0 R0.5 N 0.5 R ± .01 R 500 N 500 R ± 20 R5 N 5.0 R ± 0.2 R 1000 N 1000 R ± 20 R10 N 10 R ± 0.2 R 5000 N 5000 R ± 200 R50 N 50 R ± 2.0 R 10000 N 10000 R ± 200 R
Linearity Error Test to MIL-L-85762A B30.6 over 8 decades
-10
-5
0
5
10
1.0E-01 1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07
Lamp Intensity [arbitrary units]
% L
inea
rity
Err
or
MIL Spec.
MIL Spec.
Linearity Error Test to MIL-L-85762A B30.6 over 8 decades
-10
-5
0
5
10
1.0E-01 1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07
Lamp Intensity [arbitrary units]
% L
inea
rity
Err
or
MIL Spec.
MIL Spec.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Viewing SystemViewing System
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
The viewing system is specified in many sections of MIL-L-85762A Appendix B, and essentially describes the performance of the telescope used to align devices prior to
measurements. To summarize:
B30.9 and B40.2.1 and B40.4 Measurement of a 0.007" spot is available.B30.10 Max. View/Measure alignment error of 5%.B40.5 Max. View/Measure alignment error of 0.002".B40.4 Minimum focal distance of 4".
The viewing system is specified in many sections of MIL-L-85762A Appendix B, and essentially describes the performance of the telescope used to align devices prior to
measurements. To summarize:
B30.9 and B40.2.1 and B40.4 Measurement of a 0.007" spot is available.B30.10 Max. View/Measure alignment error of 5%.B40.5 Max. View/Measure alignment error of 0.002".B40.4 Minimum focal distance of 4".
The OL 600-NVGtelescope meets
ALL of these specifications
The OL 600-NVGtelescope meets
ALL of these specifications
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Luminance MeasurementEquipment
Luminance MeasurementEquipment
B40.1 Luminance measurement equipment.
Luminance measurements can be made using either a spectroradiometer meeting the requirements of B30 through B30.11.1 above or a photometer meeting the requirement herein. When a photometer is used as part of the test equipment, the following calibrations and checks shall be verified within a year prior to taking a measurement in order to assure that the photometer meets the requirements of this specification. Records of calibrations and checks shall be maintained by the contractor and shall be available for government inspection.
B40.1 Luminance measurement equipment.
Luminance measurements can be made using either a spectroradiometer meeting the requirements of B30 through B30.11.1 above or a photometer meeting the requirement herein. When a photometer is used as part of the test equipment, the following calibrations and checks shall be verified within a year prior to taking a measurement in order to assure that the photometer meets the requirements of this specification. Records of calibrations and checks shall be maintained by the contractor and shall be available for government inspection.
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
OL 750-NVGspectroradiometer
OL 600-NVG-Pphotometer
Measure both wayswith ONE system
Measure both wayswith ONE system
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Photometer PolarizationError
Photometer PolarizationError
MIL-L-85762A MIL-L-85762A RequirementsRequirementsMIL-L-85762A MIL-L-85762A RequirementsRequirements
B40.6 Photometer polarization error.The polarization error shall be no greater than 1%
NOTEThis specification is actually in the wrong section. Photometers rarely show polarization errors, but
spectroradiometers are generally highly sensitive to polarization. Proper luminance (and radiance)
measurements with spectroradiometers can only be done if de-polarization optics are added.
B40.6 Photometer polarization error.The polarization error shall be no greater than 1%
NOTEThis specification is actually in the wrong section. Photometers rarely show polarization errors, but
spectroradiometers are generally highly sensitive to polarization. Proper luminance (and radiance)
measurements with spectroradiometers can only be done if de-polarization optics are added.
Measure LCD and AMLCDDisplays without error
Measure LCD and AMLCDDisplays without error
OL 750-NVGspectroradiometer
OL 600-NVG-Pphotometer
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Beyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762A
Dynamic rangeThe brightest intensity measurable
divided by the lowest (without changing the conditions of testing).
Dynamic rangeThe brightest intensity measurable
divided by the lowest (without changing the conditions of testing).
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Beyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762A
There is no specification for dynamic range,
but….MIL-L-85762A implies that the
sensitivity specification applies at all luminances
There is no specification for dynamic range,
but….MIL-L-85762A implies that the
sensitivity specification applies at all luminances
PMTs have very limited dynamic range so most systems must
ignoreMIL-L-85762A sensitivity specifications when testing sources brighter than 1 fL
PMTs have very limited dynamic range so most systems must
ignoreMIL-L-85762A sensitivity specifications when testing sources brighter than 1 fL
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
The OL 750-NVGfeatures 10 decadesof dynamic range
for each measurement,so bright sources can be measured while meeting
MIL-L-85762A sensitivity specifications.
The OL 750-NVGfeatures 10 decadesof dynamic range
for each measurement,so bright sources can be measured while meeting
MIL-L-85762A sensitivity specifications.
Beyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762A
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Scan SpeedScan Speed
Beyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762ABeyond MIL-L-85762A
There are no high There are no high or low scan speed or low scan speed limitations limitations specified, but specified, but faster is preferred.faster is preferred.The OL 750-NVG The OL 750-NVG can give quality can give quality NVIS results in 2 NVIS results in 2 minutes or less.minutes or less.
There are no high There are no high or low scan speed or low scan speed limitations limitations specified, but specified, but faster is preferred.faster is preferred.The OL 750-NVG The OL 750-NVG can give quality can give quality NVIS results in 2 NVIS results in 2 minutes or less.minutes or less.
1E-14
1E-13
1E-12
1E-11
1E-10
1E-9
1E-8
1E-7
1E-6
1E-5
Sp
ectr
al
Ra
dia
nce [
W/c
m²
nm
sr]
300 400 500 600 700 800 900 1000
Wavelength [nm]
0.14 fL source 109 fL source special "IR" source
1E-14
1E-13
1E-12
1E-11
1E-10
1E-9
1E-8
1E-7
1E-6
1E-5
Sp
ectr
al
Ra
dia
nce [
W/c
m²
nm
sr]
300 400 500 600 700 800 900 1000
Wavelength [nm]
0.14 fL source 109 fL source special "IR" source
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Special FeaturesSpecial Features Special FeaturesSpecial Features
Sometimes, Sometimes, when testing when testing cockpit displays, cockpit displays, you need to you need to climb into a climb into a cockpitcockpit
Sometimes, Sometimes, when testing when testing cockpit displays, cockpit displays, you need to you need to climb into a climb into a cockpitcockpit
With a fiber-optic cable, you can make
measurements anywhere with the OL 750-NVG
With a fiber-optic cable, you can make
measurements anywhere with the OL 750-NVG
Remove the OL 600-NVG base to reveal a
tripod mounting thread
Remove the OL 600-NVG base to reveal a
tripod mounting thread
The supplied baffle-tube is ideal for quick focus and low stray light, just place the end against the
cockpit display
The supplied baffle-tube is ideal for quick focus and low stray light, just place the end against the
cockpit display
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
OL 750 software is
fully Windows 95/98/NTTM compatible
OL 750 software is
fully Windows 95/98/NTTM compatible
Special FeaturesSpecial Features Special FeaturesSpecial Features
Multi-Spectral
plots
Multi-Spectral
plots
CIEPlots
&reports
CIEPlots
&reports
Multiple browsers for easy
storage & retrieval
Multiple browsers for easy
storage & retrieval
MIL-spec & custom Pass/Fail
MIL-spec & custom Pass/Fail
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Special FeaturesSpecial FeaturesSpecial FeaturesSpecial Features
Scan wizard makes calibrations and Scan wizard makes calibrations and measurements easy for any usermeasurements easy for any user
Calculations according to MIL-L-Calculations according to MIL-L-85762A85762A
Users can add customer/vendor Users can add customer/vendor specificationsspecifications
NVIS conformance reports with NVIS conformance reports with choice of layoutchoice of layout
Scan wizard makes calibrations and Scan wizard makes calibrations and measurements easy for any usermeasurements easy for any user
Calculations according to MIL-L-Calculations according to MIL-L-85762A85762A
Users can add customer/vendor Users can add customer/vendor specificationsspecifications
NVIS conformance reports with NVIS conformance reports with choice of layoutchoice of layout
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
Special FeaturesSpecial FeaturesSpecial FeaturesSpecial Features
Many other useful built-in color Many other useful built-in color calculations: LAB/LUV, CRI etccalculations: LAB/LUV, CRI etc
Powerful Macro facility for user Powerful Macro facility for user manipulations using equation editormanipulations using equation editor
Radiometer/photometer software is Radiometer/photometer software is built-in to OL 750 spectroradiometer built-in to OL 750 spectroradiometer software – no switching programssoftware – no switching programs
Many other useful built-in color Many other useful built-in color calculations: LAB/LUV, CRI etccalculations: LAB/LUV, CRI etc
Powerful Macro facility for user Powerful Macro facility for user manipulations using equation editormanipulations using equation editor
Radiometer/photometer software is Radiometer/photometer software is built-in to OL 750 spectroradiometer built-in to OL 750 spectroradiometer software – no switching programssoftware – no switching programs
The list of special features goes on and
on…
The list of special features goes on and
on…
Optronic Laboratories, Inc.Optronic Laboratories, Inc.
More InformationMore InformationMore InformationMore Information
The features illustrated represent The features illustrated represent just a few of the main benefits of the just a few of the main benefits of the OL 750-NVG systemOL 750-NVG system
For more information:For more information: Contact your local Optronic Contact your local Optronic
Laboratories’ representativeLaboratories’ representative Visit our website at Visit our website at www.olinet.comwww.olinet.com
The features illustrated represent The features illustrated represent just a few of the main benefits of the just a few of the main benefits of the OL 750-NVG systemOL 750-NVG system
For more information:For more information: Contact your local Optronic Contact your local Optronic
Laboratories’ representativeLaboratories’ representative Visit our website at Visit our website at www.olinet.comwww.olinet.com
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