Slide 1 By Praveen Venkataramani Vishwani D. Agrawal TEST PROGRAMMING FOR POWER CONSTRAINED DEVICES 5/9/201322ND IEEE NORTH ATLANTIC TEST WORKSHOP 1 Slide 2 AGENDA Problem…
PowerPoint Presentation Power Problems in VLSI Circuit Testing Keynote Talk Vishwani D. Agrawal James J. Danaher Professor Electrical and Computer Engineering Auburn University,…
Reducing ATE Test Time Using Voltage and Frequency By Praveen Venkataramani Vishwani D. Agrawal Test Programming for power constrained devices 5/9/2013 22nd IEEE North Atlantic…