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Page 1: Common Presentation Rev0

© VTI Instruments Corp.

Core ATE Seminar

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© VTI Instruments Corp.

Agenda

Introductions to Corporate - 1 Hour- Axis Aerospace & Technologies- VTI Instruments Inc- Teradyne Inc

Challenges of test systems and their management - 1 Hour

Case studies of “Core ATE” Solutions - 1 Hour

Technologies & Standards behind Core ATE - 1 Hour

Development of core ATE & pitfalls to avoid - 1 Hour

Demo of a Core ATE system - 1 Hour

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© VTI Instruments Corp.

1. On our coprporate slide set there is no need for axis or teradyne logos. 2. For teradynes and AXIS corporate presenatation, use their formats, not

ours. This way no need to mess with their colors or layout. It will also make us look more professional and state of the art then them

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© VTI Instruments Corp.

CORPORATE INTRODUCTIONS

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© VTI Instruments Corp.

Industry Leading Data Acquisition and Precision Instrumentation Provider

Globally Ranked 6th by Frost & Sullivan

Worldwide Sales, Service & Support

Industry Recognition fromPeers and Customers

Serve High Reliability Markets Where Measurement

Performance is Critical

Design and Deliver Precision Modular Instrumentation and

Data Acquisition Systems

Leading Supplier of Data Acquisition

Hardware and Software

Electronic Test

Embedded Electronic Applications

Mechanical / Environmental Monitoring & Test

Military / aerospace

Energy / power generation

High-end consumer goods and medical devices

VTI Instruments CorporationI N T E G R A T E D D A T A A C Q U I S I T I O N , D I S T R I B U T I O N & C O N T R O L

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© VTI Instruments Corp.

REMOVE this slide, use the slide slide to mention we have been in business since 1990 and are the sixt largest supplier. This slide is TOO product centric, we need to also focus on subsystems

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© VTI Instruments Corp.

VTI Instruments Corporation L E A D A N D D R I V E I N D U S T R Y D E V E L O P M E N T A C T I V I T I E S

VXI Consortium PRESIDENT

LXI Consortium CO-FOUNDER

Western Region Strain Gauge Board BOARD MEMBER

VITA Technical Committee ACTIVE MEMBER

IVI Foundation ACTIVE MEMBER

PCI-sig ACTIVE MEMBER

PXISA ACTIVE MEMBER

Structural Dynamics Research Consortium SPONSOR MEMBER

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© VTI Instruments Corp.

Functional Test Instrumentation & SwitchingBased on Open Industry Platforms – VXI, LXI and VME

Time Stamp DMM Digitizer AWG/FG D/A A/D Comparator Counter Digital IO Relay Driver Serial IO Prototyping

Matrix Multiplexers Low level High power Splitters Loads Optical RF uWaveCustom

Remove ticks, and colors from background on VMIP. Ask Phil/Chiatra to provide clipped images with no background. We have them, simply ask for them. Also focus on subsystems as well- get pictures of chassis with interfaces. Need to stress we go from instrument to subsystem

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© VTI Instruments Corp.

Who Relies On VTI ProductsA E R O S P A C E & D E F E N S E / P O W E R & E N E R G Y G E N E R A T I O NR F & M I C R O W A V E / T R A N S P O R T A T I O N / C I V I L E N G I N E E R I N G

AAI

Ameican Axle

BAE Systems

BNSF

Boeing

Bose

Broadcom

Cambridge Systems

Caterpillar

Cenco

Delphi

Detroit Diesel

DFAS

DME

EADS

Eaton

FAA

Ferguson

FEV Engine

Ford Motors

General Electric

General Dynamics

General Motors

Hamilton Sundstrand

Harris Corporation

Hitachi

Honda

Honeywell

Indra

Intel

ITT Aerospace

Jabil

Jacobs Technology

KAPL

Kirby Risk

Knolls Atomic Power

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© VTI Instruments Corp.

Korea Aerospace

LMCO

Mack Trucks

Man Tech

MBDA

MDS Aero

Motorola

MTS Systems

MTU Aero Engines

NASA

NUWC

Nicom International

Northrop Grumman

NREL

Otis Elevator

Pratt & Whitney

Raytheon

RIM

Robert Bosch

Rockwell Automation

Rolls Royce

Sandia National Labs

Selex Galileo

Siemens

Solar Turbines

Sytronics

Techspace Aero

Tecumseh

Teradyne

Textron

Trane

US Army

US Navy

USAF

Vought

Westinghouse

Who Relies On VTI ProductsA E R O S P A C E & D E F E N S E / P O W E R & E N E R G Y G E N E R A T I O NR F & M I C R O W A V E / T R A N S P O R T A T I O N / C I V I L E N G I N E E R I N G

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© VTI Instruments Corp.

Precision Measurement Capabilities

VTI Instruments is the only company capable ofdelivering PRECISION MEASUREMENT CAPABILITIES across

all of the following technical disciplines:

Scalable Signal Switching and RoutingSwitching core for virtually all automated test systems worldwide

Digital Multimeters and VoltmetersOne of only 4 companies worldwide delivering 7 ½ digit DMM capability

Comprehensive Multifunction Signal Generation and MeasurementOne of the top 3 modular instrumentation companies worldwide

Temperature, Frequency, Pressure, Position, and VoltageOne of top 3 companies worldwide for temperature and voltage accuracy

Fatigue, Stress, and LoadOne of the top 2 companies worldwide for precision stress and bridge

Dynamic Signal Analysis / Noise Vibration HarshnessRecognized gold standard delivering accuracy, reliability, and repeatability

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What’s Important to Our Customers?I T ’ S M O R E T H A N J U S T B I T S , B Y T E S , A N D S A M P L E R A T E S

Capital PreservationCOTS Solution

Obsolescence mitigation

FlexibilityGranular platform

Simplified re-configurability

Data AccessWWW data and alarm notification

WWW health monitoring

Measurement Confidence

Integrated signal conditioningRun-time self calibration

Training & UsabilityIntuitive tools and interfaces

Reduced points of failure

Facility UptimeQuality

Embedded NIST Calibration

ServiceabilitySimplified troubleshooting

Reduced maintenance expense

Simplified InstallationDistributed: setup and debug

Distributed: installation

Customer DrivenProduct

Development

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© VTI Instruments Corp.© VXI Technology, Inc.

Integarte core ATE and DAQ slides together, not just DAQ

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© VTI Instruments Corp.

Why Are We The Gold Standard?I T ’ S M O R E T H A N J U S T A C O L L E C T I O N O F A / D C A R D S

INTEGRATED DATA ACQUISITION DESIGN PHILOSOPHY

System level design from the transducer through to the digitizer

Signal conditioning including filtering, gain, excitation, self-calibration

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VTI Instruments (India)

What does VTI do in India…

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Teradyne OverviewHeadquarters: North Reading, Massachusetts

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Teradyne: Because Testing Matters

Teradyne is the largest supplier of COTS instrumentation, test subassemblies, and ATE used by defense and aerospace electronics manufacturers, depots, and intermediate-level facilities worldwide. Teradyne’s test equipment and instrumentation products ensure the mission readiness of defense and aerospace customers.

17

Teradyne Background, Experience and Capabilities are Leveraged to Ensure Best Value for Defense and Aerospace customers

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Teradyne Positioned for the Future

Market leader in semiconductor and electronic system test

New product strategy driving growth

Business model delivering strongfinancial performance

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System-On-Chip TestSemiconductor Test• System-On-Chip (SOC) Test

• Leading wireless, mixed signal, microcontroller and performance analog test systems

• Memory Test• Highest Throughput Flash and High

Speed DRAM Solutions

• Largest installed base for SOC test• 9,000+ UltraFLEX, FLEX, J750, IP750, ETS, and Magnum

systems installed at IDM, Fabless and OSAT customers 2010 Sales = $1,600MSystem Test Group• Defense & Aerospace Board

Test• Defacto standard for digital test across major

branches of DoD

• Hard Disk Drive Test• Industry’s most productive 2.5” HDD Systems

• Commercial Board Test• Patented low voltage test technology delivers

highest yield in-circuit board test

• Automotive Diagnostic Solutions• Vehicle test and diagnosis for service bay and

manufacturing

Annual Revenue2007 $1,102M2008 $1,107M2009 $ 819

M2010

$1,609M

Our Products Lead the Industry

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Teradyne Has Over 30 Years of Experience in the Defense and Aerospace Market

L2xxL3xx

1980 1990

Spectrum 9100

VXI Analog

CASS DTU

VXI Digital

2010

VXI Serial Bus

2000

M9-Series Di-Series

Ai-710

Ai-760

Bi-41X

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US DoD Programs (continued)Javelin MissilePatriot Launcher & MissileMaverick MissileTomahawk MissileStinger MissileNESP Satellite Trident BSY-1, BSY-2Europe MOD Military ServicesStandard GP DATETornado EW-ECMHarrier EW-ECMDassult Mirage – various avionicsAsian Military Services/ProgramsIndian Navy – Ashok programBEL-GAD – SRE Radar projectJapan Air Force F-15 avionicsKorean Air Force F15 avionicsSingapore Air Force F15 avionicsCommercial ProgramsAir India – 777 & 737 avionicsJapan Airlines -777 & 737 avionics

US DoD Programs• A-10 FCC TEMS• A-10 avionics• AC-130U• AWACS radar• B-1 avionics• B-1 power controls• B-1 ADTS• B-2 avionics• C-5 avionics• C-17 avionics• C-130 avionics• E-8 Joint Stars• F-111 avionics• F-15 avionics• F-16 avionics• F16 Radar• F-18 avionics• F-22 avionics• Advanced Cruise Missile• AMRAAM Missile• Minuteman Missile• EKV – Exo-atmospheric Kill Vehicle

Spectrum 9100 Test Systems: The Next Generation Serving Military Test Applications

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ATE Design With Modular COTS Tailored To the Application

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Instruments

Subsystems

Systems

Teradyne COTS Solutions Include….

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Axis Aerospace & Technologies

(Insert from Axis standard corporate introduction)

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To build a powerful franchise of Aerospace technology, Engineering, Infrastructure and Lifecycle support business, strategically aligned to each other to produce

enduring value for all stake holders and to become the first choice partners to Aerospace and Defence majors around the world

Aviation Eco System Global Partnership Holistic Solutions

Hassan Airport (HAP)Hassan Aviation Cluster (HAC)Devanahalli Aviation Cluster (DAC)

AAT

NACIL MROTrainingNIATM

Mil/AeroEngineering Services

Acquisitions

CompellingValue for all

Stake holders

JAL Infrastructure

Landscape

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Metamorphosis of Portfolio

axisVidhyaCom

Technologies(2005)

Microcon International

(2006)

Axis IT &T

(2007)

With the objective of creating powerful technology portfolio in the area of Aerospace and Defence, AAT has acquired many

companies in the last 3 years and many more are in the pipeline.

AATSince 2005C4I2ElectromagneticsRT & Secure OSSystems Integration

VidhyaComSince 1998Aerospace Tech-pubAirbus Tier 1 since 1999Interactive Visual SimulationCBT/SBT for Aviation Training

MicroconSince 1983Avionics & LRU productRealizationMilitary Embedded SystemsATEOver 5000 man years experience

Axis IT&T Since 1987Mechanical DesignConversionAnalysisOver 2000 man years experience

CADESDigitech(2009)

Cades Digitech Engineering DesignAerospace, Defence, Automotive400 EngineersE2S SupplierOver 60 Global clients

Raaga Design(2008)

Raaga DesignSince 2000Receivers/Emitters1.5 MHz to L BandPower AmplifiersAntennae

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NCR : NOIDA14,000 Sq. FtMechanical Design60 Engineers GurgaonSoftware: 40 Engineers Defense ColonyLiaison OfficeBikaji Cama PlaceSales Office

Bangalore : Richmond Rd, 150 Engineers, Infantry Rd 150 EngineersElectronic City: Mil-Aero Division : 50 EngineersBommasandra Industrial Area: 15,000 sq ft., Mech./Elec. & SI facilities,

Hyderabad : Banjara Hills: 10,000 Sq Ft Mechanical Design; 50 EngineersTrimulgherry: 5000 Sq FtRF & Microwave; 20 Engineers

UK : Leicestershire 5000 sq ft, Mech./Elec. Design 40 EngineersGermany : 60 EngineersFrance: ToulouseLiaison OfficeItaly: MilanoLiaison Office

USA : Peoria, IL : 10,000 sq ftMech./Elec./Emb. Design80 engineersSan Jose, CA, Sales officeDaechon, Korea: Tokyo, JapanSales & Engineering Center

Global Footprint

Chennai: 5000 Sq FtMechanical Design; 100 Engineers

Peoria, Illinois Toulouse, France

Bangalore

Leicestershire, UK

San Jose, CA

DelhiHyderabad

Chennai

Tokyo, Japan

Hamburg, Germany

Milano, Italy

Sao Paulo, Brazil

Daechon, Korea

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Mil-Aero

• Defence Systems• Microwave & RF Products• System Integration• Government/PSU Solutions

Design andEngineering Services

• Structures• Analysis• Design to Build

• Hassan Airport• Hassan Aviation Cluster• Devanahalli Aviation

Cluster

Life Cycle Support

• MRO• Training• NIATM

Airport & Infrastructure

Portfolio

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Aerospace Infrastructure

Hassan Airport• 950 Acres, Green field project• Concession Agreement with GoI signed• Passenger Terminal + Cargo + MRO • Runway 3.6 KMs length, 60 meters width, A380

compliant• 100,000 Sq. Ft, 4 Mn Passengers/year

Aviation Cluster (Hassan and Devanahalli)• Aerospace focus• 900 acres in HAC and 75 acres in DAC• Defence and offset focus• Heavy Maintenance• Modification• Major Component Overhaul• Logistics Park• Parts Center• Type Rating and Ab-Initio Training facilities• Engine Test Cell

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Aviation Life Cycle Support

Simulators/Training• Discussions to set up Type

rating center for commercial aircraft.

• Partnership with Thales Simulation Systems

Aircraft MRO• JV with NACIL,EADS• Leverage the current MRO of

NACIL• Start with 3 Hangars at Delhi• C checks for all commercial aircraft

in India• Capacity expansion to handle 200

aircrafts in 5 years

NIATM• LoI to operate the National

Institute of Aviation Training and Management from Airports Authority of India

• Conduct AME course and Aviation Management MBAs

• Enroll 300 students per year.

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Aerospace Engineering

Leading product design and engineering services , consulting

and R&D services to the Aerospace, Defense & Automotive

Industries.

400+ people serving Clients across the Globe

AS9100B, ISO IEC 27001, ISO 9000 2001 certified. Has DGCA,

CEMILAC and Airbus approvals.

in India and has offices in over 10 countries including 4 offices

through business partnerships.

Conceptual Design

Manufacturing &

Testing Support

Structural Design Simulation Stress /Fatigue/ Loads

PLM & Tech Pub

Systems Design/

Integration/

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Aerospace Programs Participation

Westland Future Lynx KAI-KHP Program

Embraer MSJ/MLJBoeing 787 Boeing 747-8

Airbus A350XWBAirbus A400MAirbus A380

Embraer ISR Program

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Mil-Aero : Activity Profile

Microwave & RF• Hand Held Radio• V/UHF Ground to Air Radio• Electronic Warfare Systems• Spectrum Monitoring &

Management Software & Simulation• Systems Software• Real Time & Secure OS• Simulation Software• Embedded Systems

Software

• Radar Data Processors• Multi Sensor Tracking• Air Defence Decision Support• Integrated Air Space Situational Displays• NCW

System Integration• ATE (VXI,PXI,CPCI)• Mechanicals-Test Rigs, Fixtures• Assembly• Interface Design• EMP Hardening

C4I2

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Experience Highlights

Projects Implemented :-

Command and Control Systems:• Design and Development of Radar Data Processors• Tracking of targets from multiple radar systems• Integrated Air Situation Display and Operational Control• Development of Command and Control Systems

Electronic Warfare:• Design, Development of Integrated EW Systems• Stand Alone Jammers

SNORD:• Smart Neutralization of remotely controlled explosive devices• Ruggedized, mobile SNORD for operational purposes

Systems: Development of Real-time Linux platform for various productsHighly configurable, reliable kernel

Radar Data Processors

Jammer/SNORDIntegrated Air Situation DisplayCommand, Control, Communication

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Experience Highlights

LRUs:• Mission Computer for LCA: Design Development• Display Processor for LCA, Su-30: Design and Development• MPRU for LCA: Design, Development, Prototyping, Qualification• KA-DECU for LCA: Design, Development, Prototyping

Others:• Planar Scanner-Design, Development, Manufacture• ECS: Environmental Simulation System for LCA• Video Tracker: Automatic Target Tracker for RPV: Design Development &

Manufacture

ATEs:• Ground Check Out System for LCA: Design, Development, System Integration• ATE for MC, DECU, DP: Design, Development & System Integration

Project Management: Over 5000 Man Years of Experience in LCA,Su-30

Mission Computer

Display Processor

Digital Engine Control Unit

Video TrackerMission PreparationRetrieval UnitCommand Control Computer

Mission Computer Test Station

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Experience Highlights

Developed over 100 CBTs catering to Cockpit / Cabin / Maintenance Crew Training for almost all Airbus range of Aircraft as Tier 1 supplier to airbus.

In 2004 became Tier 1 Supplier in Technical Publishing and Tier 2 supplier for Aerospace Engineering Services working in A380, A330 projects

Notable experience are in TSM, AMM, IPC and WDM for aircraft.

At present this division is undertaking new projects in Tech-publishing.

Developing Airport Visuals of all airports in India

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Experience Highlights

• Design, Development, Qualification Testing, Field Trials (IAF) and Product Support experience in the field of Communications and Navigation Systems

• 108 – 400 MHz / 30 – 407 MHz / 30 – 512 MHz and L- band

• Air borne / Ship borne / Ground applications and Hand Held radios

• Test facilities for Design / Development and Manufacturing

• Preferred Designers for: ECIL & HAL Hyderabad, DRDO Dehradun & Goa

• Electronic Warfare Systems, Low Power Jammers• Software Defined / Configured Radio• Frequency Hopping (500 H/S) Radio

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Quality & Certifications

ISO 9001:2000

Licensed for Defense

ManufactureCMMi Level 3

Global best practices for product quality and process quality

ISO/IEC27001 DGCA Airbus Approval AS9100B CEMILAC

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What Axis can do ?

1. Aviation Infrastructure & Life Cycle Support• Airport/Aviation Cluster – Hassan, Devanahalli • MRO for Aircraft, Engines, Accessories• Statutory Checks, Upgrades, Refurbishment, Life Extension Studies• Logistics Park, Spares Centre & Knowledge Centre

2. Simulators and Training• Simulators - FFS, FBS, MBS, CBT• Training – Cock Pit, Cabin, Flight Engineer & Ground Crews• Technical Publishing & Automated Test Systems

3. System Development and Integration• Network Centric Warfare• Command & Control Systems• Communications & Electronic Warfare• Radars • Avionics Systems and Subsystems• Engineering Analysis and Design• System Integration• EMP Protection

4. Program Management• Huge Work package handling, Partner/Vendor Management & Quality Control• Offsets Management

5. Investments• JVs & Acquisitions

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CHALLENGES IN TEST SYSTEMS MANAGEMENT

Agenda item

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Challenges of Test systems management

(Praveen & Teradyne slides)

Assuming that the slides in other PPT will be integrtaed here

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Typical Test realization with Aircraft Manufacturers and Air Force Depots

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Improved Test Realization

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Players in Weapons System Program

DoD

Prime Contractor

Sub-contractors (OEMs)

End-user

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Time

Typical Military and Aerospace program life cycle

Development~ 4yr

• System Integration• System Demonstration• Low Rate Initial

Product

Deployment~6yr

• System Integration• System Demonstration• Low Rate Initial

Product

Sustainment~20yr

• Logistics management• Repair & Support• System upgrade

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Major Military and Aerospace Programs useDifferent ATE Strategies

Driven by Prime

Development Deployment Sustainment

• Potential Users• Factories• Depots• Intermediate• Subcontractor Role• Sustainment

business defined

• Driven by Prime, Sub Contractor or End User

• Driven by End User

• Potential Users• Depots• Intermediate

• Potential Users• Depots• Intermediate

• Subcontractor Role• Sustainment

business NOT defined

• Competitive as the subcontractor loose the repair business

• Subcontractor Role• Sustainment

defined by existing TPS

• May be involved in rehost effort

• Major Issues• TPS data rights

defined• TPS diagnostics

defined

• Major Issues• No TPS data rights• No TPS

diagnostics

• Major Issues• TPS data rights

defined by existing TPS

• TPS diagnostics defined by existing TPS

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Teradyne/VTI Dominate Major US Programs

Navy CASS

Marines RTCASS

Marines Viper-T

Army IFTE V5, V6 (NGATS)

Air Force VDATS

All Services:Teradyne S9100

Air Force LMSTAR

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Challenges faced by US Air Force Depots

Multiple aircraft platforms that range over 50 years of technology

Multiple specialized test equipments that are quickly becoming obsolete

Require base level of standardized core that could be expanded for specific need

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CASE STUDIES

Agenda item

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VDATS (Versatile Depot ATS) Common-Core Tester

Created and designed a common-core tester concept as the solution for a major USAF depot

Implement a Digital-Analog (DA) tester with a common-core set of state-of-the-art instrumentation

DA tester provides capability to test 80% of current depot workload

Addition of RF auxiliary unit increases testing capability to 95% of current depot workload

Provide capability to move workload among common-core testers

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Implementation: ATS Transformation Versatile Depot ATS (VDATS)

USAF developed common core depot ATS

Open system architecture with modular H/W & S/W design

Level III drawing package

COTS components

Reduced maintenance footprint increasing workload capacity

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USAF VDATS With VTI/Teradyne Instrumentation

• Digital-Analog (DA) tester with common-core instruments• DA-1 and DA-2 with:

• 336 (DA-1) / 528 (DA-2) M9-Series Digital Test.• 4 Modules BI4 Serial Bus Instrument.• VTI switching I/O core (VXI SMIP)

• Radio-Frequency (RF) auxiliary tester• Microwave test capability up to 20 GHz (stimulus) and 26.5 GHz (measurement)

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VDATS DA-1 (Digital-Analog Tester)

US Air Force VDATS Common Core Configuration

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USAF VDATS Common Core and RF Auxiliary Unit

VDATS DA-2 with RF Auxiliary Unit

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Result: VDATS Replaces Legacy ATE in the Depot

ALM205 (1982)HP DTS-70 (1985)

MMTS (1988) (F-15)

WJ 1560 (1985)

Marathon 8200 (1982) (B-52, C-130)

COMETS (1969)

A-10 IATS (1983) (A-10)

IFTE (1989) (GPS)IE 390 (1982) (F-15, F-16)

Versatile Depot Automatic Test Station(VDATS)

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Teradyne and VTI Core Instruments & Switching Sub-System are at heart of VDATS

Ai-760

Multi-Function Analog

DI-Series Parallel Digital

Bi-411 Bus

VTI Switching Matrix

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JSF/F-35

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Problem Statement: Standardize Global Support for JSF/F-35 to keep sustainment cost down

DoD required LMC to take responsibility on cost for the total program life cycle.

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Solution: LM-STAR ATE

LMC concluded to keep over all program cost down they have to define a common core ATE – LM-STAR

LM-STAR Standard Features

Open Hardware and Software Architecture

Over 1400 I/O User Interfaces to Interface Test Adapters(Expandable to over 4000 I/O)

Windows Based Software Environment

Test Software available in ATLAS, Lab Windows CVI, Microsoft C++ and others

Low MTTR and High MTBF

User Friendly Self test and Calibration Techniques

CE Qualified

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Implementation: 4 Standard Configurations

LM-STAR is tailorable to each customer need based on 4 standard configurations

Analog

Digital

Radio Frequency/Electronic Warfare

Electro-Optic (Under development)

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LM-STAR with Teradyne Instrumentations

Analog modelTeradyne’s Bi Series

1553

RS232/422/485

IEEE-488

ARINC229

JSF 1394B (Firewire)VTI’s Modular Instruments

VMIP

VTI’s Scalable swicthingSMIP

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LM-STAR with Teradyne Instrumentations

Digital model

Has all the capability of the Analog model plus

300 channels of Teradyne’s Di Series

Digital probe

TestStudio

Boundary Scan

Ai710

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LMSTAR RF/EW and Electro-Optic configurations

RF/EW modelDigital model plus

COTS RF Instrumentations

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Teradyne Spectrum 9100 Systems: USAF C-17 CATE and D-CATE

C-17 CATE I-Level and D-CATE Depot Test System

CSi Digital, Analog, and Bus instruments

Over 20 systems

Over 50 legacy TPS’s re-hosted

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USAF C-17 CATE Configuration

VP-90 Series 3-Tier Receiver

Commercial PC•Windows XP•TestStudioTM

•VisualStudio.NET

Switching Subsystem

Analog Subsystem

Digital Subsystem Power Supply Subsystem

Mechanics•(4) VXI Chassis•IEEE-488 Interfaces•20 KVA Power Distribution•Expansion for additional requirements

Misc. Instruments

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USAF C-17 CATE LRUs testedRAFCS – Redesigned Automatic Flight Control System

FCC – Flight Control Computer

SCEFC – Spoiler Control Electronic Flap Computer

CAWS – Central Aural Warning System

ADU – Annunciator Dimming Unit

HSP – Hydraulic system Panel

LFCP – Loadmaster Forward Control Panel

TFI – Total Fuel Indicator

ESCP – Electrical System Control Panel

EES – Emergency Egress Sequencer

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USAF C-17 CATE LRUs tested

ADLCP – Aerial Delivery Lock Control PanelHSC – Hydraulic System ControllerESP – Environmental system PanelADSC – Aerial Deliver Systems ControllerFSP – Fuel System PanelMCK – Mission Computer KeyboardMCD DU – Mission Computer Display UnitWCC – Warning & Caution ComputerMCP – Multi-Function Control PanelWAP – Warning Annuniciator Panel

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USAF C-17 CATE LRUs tested

ADC – Air Data Computer

APUC – APU Controller

IECS – Controller, Environmental Control system

MFD-LCD – Multi Function Display

SAU – Signal Acquisition Unit

CSMU – Crash Survivable Memory Unit

MFDC – Controller, Manifold Failure Detection

BDHI – Bearing distance Heading Indicator

APDMC – Aircraft Propulsion Data Management System

ADTD – Aircrew Data Transfer Device

ABC – Antiskid Brake Controller

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TECHNOLOGIES & STANDARDS BEHIND CORE

ATE

Agenda item

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Hardware platform selection

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Challenges Facing the ATS Engineer Increase Time, Cost, and Risk

=

Cost RiskTime

+

+

New TPS developmentLegacy TPS re-hosting

A Wide Range of Programming Tasks:

• Module • Line Replaceable Unit (LRU)

A Wide Range of Assembly Levels:

A Wide Range of Technology:New Technology• 300mV swings (LVDS)• Fast edges

Legacy Technology• 30V swings• Slow edges

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Asynchronous Write Cycle from Instrument to UUT

Address

Data & parity

Write

Strobe

Handshake*

Write cycle Next cycle

UUT indicates it has received the data

Signals from instrument to

UUT

Handshake Signal from

UUT

Instrument indicates data is available

Asynchronous delay

Handshaking Has A Direct Interaction with UUT

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Instrument Trends:Parallel and Concurrent Test

Control

Speed

Fuel

Pressure

Temperature

Temperature

Control

Control

Pressure

Speed

Conventional Sequential Test

Parallel Concurrent

Test

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Testing Mixed-Signal LRU Requires Highly Flexible ATE Resources

Parallel DigitalParallel Digital

Parallel Multi-function Analog (MFA)Serial Bus Digital

Traditional Sequential Analog

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Multi-instrument tests cause reliability, repeatability failures

Current:The UUT has its own time domainIndividual instruments sync or handshake with the UUTInstruments do not share timingResult: Tests using multiple instruments are unstable or require external circuitry

Current:The UUT has its own time domainIndividual instruments sync or handshake with the UUTInstruments do not share timingResult: Tests using multiple instruments are unstable or require external circuitry

Digital

Analog

Serial

Serial

Serial

DAC

ADC

Monitor

DAC

Bus

Bus

Proc.

FIFO

FIFO

Multiple time domains

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Traditional Digital Board-Level Programming Techniques

LASAR TM

ATE-Specific

Simulation was the primary technique for board (SRU) TPS development 20 years ago

Simulation provides the best results if it is practical for a design

Manual language-based programming has always been used for designs that are difficult to simulate

The percentage of designs that are practical to simulate for test has decreased over time

1980 1990 2000

New designs simulated for

test

%

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The Current High-Speed Test Problem:Fast Busses with Real-Time UUT Interaction

fast, high bandwidth, low

latency, real-time interaction

• New platforms such as JSF and upgrades present test requirements that exceed the capability of existing Defense/Aerospace solutions

• Bus speeds above 50 MHz• Real-time interaction with the UUT

• Fast parallel busses with little standardization are slowly progressing toward standardized serial busses with ever-increasing data rates

• Lacking commercial solutions, the most common approach is to use custom circuitry in the test adapter

• Expensive to replicate and support over time• System throughput is often inadequate• Difficult to program and control from TPS

1 100M10M 400M 800M 1G 2G 5GM

Di-050, Bi-410

High-Speed Digital Traditional Digital

Fast Parallel Buses High Speed Serial Buses

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Switching is crucial to good design

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The Best Switching System…

…is transparent to the system Even the best switching system degrades a signal

…can route signals from DC to light Using a modular approach to increase flexibility Single Vendor for Support

…takes up minimal footprint More room for other test instrumentation

…is optimized for the device to which it is connected 300 V DMM should use relays capable of switching 300

V

…utilizes shield planes to maintain full path impedance

Interruptions in return path degrade signals

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Accurate Instrumentation Requires Performance Signal Routing

10 mV

Typical PC Switch Card•-60 dB crosstalk @ 100 kHz•10 mV noise added to 100 mV signal•100x error when compared to higher

integrity switch card

31 uV

Typical PC Switch Card•-90 dB crosstalk @ 100 kHz•31 uV noise added to 100 mV signal

• Maximize full range of measurement instrument capability

2 digits are lost off a measurement instrument

due to the crosstalk

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• Comparison of rise time measurements, input to output

An inadequate switch will result in inaccurate readings

Input Signal, Rise Time = ~6 ns

Output through low b/w switch rise time ~ 160 ns

Output through high b/w switchRise time ~10 ns

Typical PC Mux Card• 10 MHz Bandwidth, -3dB

VTI Mux Card• 50 MHz Bandwidth, -3dB

Reliable Test Results Require Precision Signal Routing and

Distribution

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VTI Switching Solutions…

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Instrument Drivers

High-level, intelligent, instrument-specific or instrument class-specific piece of software intended to make programming simpler

Types of Instrument drivers Proprietary & ADE specific

• LabVIEW drivers

• VEE Panel drivers

Traditional / Classis • VXIplug&play & CVI Plug&Play

• IVI-C flavor

PC Standard• IVI-COM flavor

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Instrument Drivers Vs Direct I/O

Direct I/O: Use I/O libraries with Read() and Write() functions to send commands directly to the instrument.

Drivers: Driver function calls are made directly from the application

Instrument DriverApplicationVendor API

VISAHardware Driver

Instrument

Application

Vendor APIVISA

Hardware Driver Instrument

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VXIpnp Drivers

First open standard driver defined in Windows environment

Single driver to work with a variety of I/O protocols and programming environments

Depends on VISA for communication

Components of any VXIpnp driver: system library (.dll file for Windows) Function panel (.fp) for graphical ADEs soft front panel as .exe (GUI for driver) Windows help file Visual Basic include file

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VXIpnp Drivers

VXIpnp drivers are not just for VXI devices

To find an installed VXIpnp driver’s SFP: Example : VM3618

• C:\Program Files\IVI Foundation\VISA\WinNT\vtvm3618

VXIpnp drivers can be wrapped to work in ADE specific environments Example: VXIpnp driver of VM3618 can

be converted into a LabVIEW driver, using special tools supplied by National Instruments

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VXIpnp drivers

Learn to work with SFP

Learn to use a driver in the language of your choice

Learn to convert a VXIpnp driver into a LabVIEW driver

Not all converted drivers work well (check the functionality, before use)

Some drivers may work partially (example: VT141x’s converted LabVIEW driver many not be able to perform a data fetch from FIFO

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Instrument Drivers and VISA

VXIplug&playDrivers

IVI-C Drivers

IVI-COM Drivers

VISA-C

VISA COM

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IVI Drivers

Interchangeable Virtual Instrument (IVI) Foundation

Arbitration layer to save the programming effort

Instrument Specific / Class specific

Class specific DC Power Supply

Digital Multimeter (DMM)

Function Generator/Arbitrary Waveform Generator

Oscilloscope

Power Meter

RF Signal Generator

Spectrum Analyzer

Switch

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IVI Drivers

Generalized architecture for all Instrument specific drivers

Advantages of IVI Standardized configuration utility Standardization State caching Range checking Simulation Status checking Coercion recording

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IVI Drivers

Works with VISA to communicate with Instruments Exceptions: LAN/LXI & RS232 devices

need not to have VISA compulsorily.

C & COM Flavors IVI-COM drivers use Microsoft COM

technology to expose driver functionality. IVI-C drivers use conventional Windows

DLLs to export simple C-based functions

IVI Shared components & IVI Compliance from the ADE manufacturer are must for working

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IVI-C Instrument Drivers

Very similar to VXIplug&play drivers

Also have a Class Driver DLL Operations specific to a class of instruments, like all

DMM’s have a read voltage operation

Like VXIplug&play, excellent support in several development environments

Operating system independence

Tools for driver development IVI Driver Toolset for driver development in

• LabVIEW

• LabWindows/CVI

• Visual Studio

IVI Compliance tools for LabWindows/CVI

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IVI-COM Instrument Drivers

Works well in COM-friendly environments Visual Studio 2003 & .NET Visual Basic C# Agilent VEE Pro

One COM class has both instrument-specific and class operations (on different COM interfaces)

Tied to Windows O/S

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T&M Software Layers Overview

VXIRS 232 GPIB USB LAN

VISA (IO Software/Library)

Dire

ct

IO

AD

E S

peci

fic D

river

(N

ativ

e /

Wra

ppe

r)IVI-C class InterfaceIVI-C Class compliant specific driver

IVI-COMSpecificDriver

Your ADE

VX

Ipnp

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EX1200 Core Switching SolutionsS C A L A B L E S O F T W A R E F O R S Y S T E M S D E S I G N S

Combine multiple modules into logical subsystemsTrue ‘end-end’ path-level driver, no 3rd party software (i.e, NISE) requiredOne function call connects an I/O path with knowledge of external wiring

• Connect (INSTR_Session, AWG1_CH, UUT_J3.1)• Connect (PWR_Session, DCS2, UUT_5V PWR)• Connect (RFMUX_Session, SCOPE_CH1, UUT_J1)

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EX1200 Core Switching SolutionsS C A L A B L E S O F T W A R E F O R S Y S T E M S D E S I G N S

One unified industry-standard APIPromotes Code Reusability across all stages of product life cycle

• R&D application code can be leveraged into large-scale production environment

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EX1200 Core Switching SolutionsS C A L A B L E S O F T W A R E F O R S Y S T E M S D E S I G N S

Traditional platforms like PXI treat switches as individual modules, not a systemNo knowledge of system level wiring and interconnects without 3rd party softwarePath level switching begins and ends at the module level

•Connect (PWR1_Session, Ch1_IN, Ch1_Out)•Connect (PWR4_Session, Ch2_IN,Ch2_Out)

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Test Executive and ATML

VTI to add more details on ATML and test executive software migration

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DEVELOPMENT OF CORE ATE & PIT FALLS TO AVOID

Agenda item

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System Configuration Depend on UUT Type

Core RF EO Inertia Full

Processors

INS

Radar

EW/ECM

Sensors

System Capabilities

UU

T T

yp

e

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25

Multiple test configuration with the same core

Core RF EO Inertia Full

Processors

INS

Radar

EW/ECM

Sensors

System Capabilities

UU

T T

yp

e

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Teradyne’s Common-Core ATE Implementations for Air force & their Sub-contractors

Common-Core Base ATEAnalogue – up to intermediate frequencyParallel digitalBus testLRUs: IMDC, SMS Computer, Flight Control, Data Transfer Unit, Data Transfer Cartridge, Electronic Flight Instrument

Common-Core Base ATEAnalogue – up to intermediate frequencyParallel digitalBus testLRUs: IMDC, SMS Computer, Flight Control, Data Transfer Unit, Data Transfer Cartridge, Electronic Flight Instrument

+RF ATECommon-Core Base ATE together withCOTS RF instruments & switching up to 26GhzLRUs: IFF, EGI, ILS, Tacan, Radar Alt, RWR, FCR

RF ATECommon-Core Base ATE together withCOTS RF instruments & switching up to 26GhzLRUs: IFF, EGI, ILS, Tacan, Radar Alt, RWR, FCR

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Teradyne’s Common-Core ATE Implementations for Air force & their Sub-contractors

+

Video ATECommon-Core ATE system together withCOTS Video instruments & Electro Optical sub-systemLRUs: MFD, SMFD, HUD, IUFC

Video ATECommon-Core ATE system together withCOTS Video instruments & Electro Optical sub-systemLRUs: MFD, SMFD, HUD, IUFC

+

+

Inertia Navigation System ATECommon-Core ATE system together withCOTS synchro-resolver & XZY tableLRUS: INS

Inertia Navigation System ATECommon-Core ATE system together withCOTS synchro-resolver & XZY tableLRUS: INS

+

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Common Core Tester Benefits

One common software programming environment

Common Test Programs Pass/fail and diagnostics

Common operational environment for end users

Most end users are no longer engineers but rather people who simply read the screen and following instructions

Common ATE maintenance strategy and tools (break/fix)

Common ATE Spares

Common ATE Configuration Management

Common ATE Obsolescence Management

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Standard ATE Promotes Reuse of Test across factory, depot, and operational maintenance.

Circuit Card Assembly

Manufacturing Process

Sub-System (LRU)

Assembly and Integration

Functional

Board Test

Operational

Box (LRU)

Test

Ship and

Final

Systems Integration

O-Level

systems test

to diagnose

failing LRU

I-Level

LRU test to

diagnose

failing SRU

Depot

SRU test to

Diagnose/repair

failing component

FAC

TO

RY

FIE

LD

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Summary of Benefits of Common Core Tester

Development costs shared across multiple applications.Increased tester work load efficiency compared to low usage across multiple ATE.Economies of scale permitted by consolidation of ATS requirements and production

learning.Stable product base for ATS production, spares and modifications.

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VTI to add more slides on Switching system configuration and tips

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© VTI Instruments Corp.Customer support at

Site

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Teradyne Support Covers All Parts of a Logistics Support Solution

Total Logistics Support Solution

Services solutions are configurable to optimize tester performance. Teradyne supplies customized support packages to MoDs for similar Programs.

Teradyne Standard High Availability Support Program

Obsolescence Management

On-site Spares & Parts

Logistics

Applications Support

On-site Training

Calibration- Verification

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Follow-on Maintenance Support PlanObjectives

Maximize availability

Improve reliability

Control Configuration

Manage Obsolescence

Maintain supportability over program life

Decrease ATE support costs

Add/upgrade system with new capabilities

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Logistic Support Strategy Analysis and Maintenance plan developmentProduct Support Strategy Analysis Topics

Parts Sparing Strategy and impact on availabilityLocal/Centralized/Hybrid

Field Service MaintenanceApplications and System Support

On-site & Off-site Applications SupportApplications and Maintenance Training

Risk AnalysisChanges to system designDeployment plan/locationsObsolescence identification and planning

The impact and value of Performance/Cost/Schedule/Sustainment tradeoffs

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Obsolescence Management Example

CONDUCT VENDOR POLLING

REVIEW RESULTS

DISCUSS VENDOR POLLING FINDINGS

REVIEW RECOMMENDATION

DETERMINE MANAGEMENT STRATEGY LAST TIME PURCHASE QUALIFY NEW INSTRUMENT AGREE ON NEW INSTRUMENT SELECTION

DECISION ON INSTRUMENTS

GENERATEECM

MEETING WITH CUSTOMER

DEVELOP QUALIFICATION

TEST PLAN

QUALIFICATION TESTING

QUALIFICATION REPORT

ADD NEW INSTRUMENT TO

ALLOWABLE LIST OR MAINTENANCE

PLAN

AGREE TO UPDATE

APPROVED

REVIEW FIRMWARE CHANGES

OBTAIN VENDOR LONGEVITY PLAN

REVIEW COMPONENT OBSOLESCENCE ISSUES

DISCUSS VENDOR END OF LIFE (EOL) PLANS

SELECT REPLACEMENT INSTRUMENT

DEFER ACTION

NO

YES

CATE OBSOLESCENCE PROCESS

ECM = ENGINEERING CHANGE MEMORANDUM

PROVIDE QUOTE FOR CUSTOMER RFQ TO REPLACE INSTRUMENT

RECEIVE PURCHASE ORDER (PO) AND START QUALIFICATION WORK

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