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Miniaturizednon-thermal atmospheric pressure plasma jet and thin film deposition
R. FoestLeibniz Institute for Plasma Science and Technology e.V. Greifswald
Micro plasmasnon-equilibrium plasmas, spatially confined to dimensions of 1 mm or lessgeneration of stable discharges at atmospheric pressure
Fascination for p lasma physics (basics) and technology (application):breakdown of 'pd scaling'high current and energy densities , electron densities as high as 5x1016 cm-3 (e.g. microcavity plasmas)emphasis of boundary-dominated phenomenaUV emission by broadband continuathree body collisions (charge carriers, radical generation ) effective gas heating and momentum transfer from the electric field to the gas molecules, gas dynamics
Advantages of plasma jets with regard to surface tr eatment:Flexible dimensions (several cm … sub-mm), local treatmentAccess to inner walls of wells, trenches or cavities .
J. G. Eden et al.,University of Illinois
20 mm
trench width: 0.12 mm
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Foest, Summer School Complex Plasmas 2010
Handheld device based on a capillary plasmajet at atmospheric pressure
H. Koinuma, H. Ohkubo et al., Appl. Phys. Lett. 60 (1992) 816
Selwyn (1998): Atmospheric Pressure plasma Jet (APPJ ) 13.56 MHz, He/O2, no dielectric between electrodes – for thin film deposition from TEOS
S.E.Babayan, J.Y. Jeong, V. J. Tu, G.S. Selwyn, R. F. Hicks, Deposition of silicon dioxide films with an atmospheric-pressure plasma jet, Plasma Sources Sci. Technol. 7 (1998) 286-288
Tool for deposition of a-C:H films
J. Benedikt, K. Focke, A. Yanguas-Gil, A. v. Keudell, Atmospheric pressure microplasma jet as depositing tool, Appl. Phys. Lett. 98, 251 504 (2006)
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Main distinctive criteria: Power density (temperature load), operating voltages (E field), Frequency, Geometry, Gas mixtures
Openair Plasma(Plasmatreat)
Atomflo D(SurfX)
Blaster(Tigres)
Plasmabrush(Reinhausen Plasma)
Spottec, Plasma Nozzle(Tantec)
Arcospot(Arcotec)
Introduction - Devices
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RF
Matchingnetwork
G1 G2 G1+P
OES
Detail of capillary…
active dischargeregion
effluent
Experimental – Plasma Source
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Source geometry, parameters
DimensionsOuter capillary: di = 4 mm, da = 6 mm, Inner capillary: di = 100 µm to 1 mm
da =1 to 2 mmadjustable relative to nozzle (z)
ConfigurationOuter ring electrodes (Cu):
upper: RF lower: grounded
Mounted on x-y plotter:dynamic deposition, v= 1 cm/s
Active plasma volume: Activation, thin film precursor formation (e.g. bydissociation, dissociative ionization)
Transport of activated species to surfaceThin film formation (plasma polymerization)
Influencing film properties:A) Energy per moleculeB) Addition of reactive gas:e.g. oxygen:Reduction of C-content in the film,
‚organic‘ → ‚inorganic‘ characterplasma polymer films → quartz-like SiOx films
+ ����
e-
metastablesexcited particles
(CH3)3SiOSi(CH3)2(+)
+CH3
(+)
+ (2 e-, Ar)
(CH3)3SiOSi(CH3)3
1 µm
SEM micrographof film edge
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-20 -15 -10 -5 0 5 10 15 200
20
40
60
80
100
[%]
r [mm]
N Si O C Br K
108 106 104 102 100 98400
500
600
700
800
900
1000
binding energy / eV
Cps Si(-O)4 Si(-O)
Si(-O)2Si(-O)3
108 106 104 102 100 98400
600
800
1000
1200
Si(-O)4
Si(-O)
Si(-O)2Si(-O)3
Cps
binding energy / eV
mm
-5 0 5
-20mm 0 mm 20mm
Si 2p-peak:
108 106 104 102 100 980
1000
2000
3000
binding energy / eV
Si(-O)4
Si(-O)3
Si(-O)2Si(-O)
Foot print
Si(-O)4, Si(-O)3 – represent “SiO2” – like anorganic film – center Si(-O)2, Si(-O) – represent plasma polymer like film, increasing org. character - edge
Local Deposition ProfileScanning XPS (Elemental composition)
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Presence of stochastic filaments
1 cm
2 ms exposure
Observation: short time discharge phenomena
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Regular filaments in rf capillary discharge –Locked Mode
Exposure: 70 ms 10 ms 2 ms
New mode, different from known stochastic filamentary mode:Locked Mode = regularily patterned, equidistant filaments with
fixed spatiotemporal relation and periodic motionConsequence: Homogenized discharge volume
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Ordered filaments
Exposure time:0.25 s …. 1 ms
D=15mm, low pressure (Ar, few mbar)
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Locked Mode
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Other Observations of Self-organization (DBD)
Anode spots, DBD, Helium (2004)
K. H. Schoenbach, M. Moselhy, W. Shi, Plasma Sources Sci. Technol. 13 (2004), 177.
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Suggestion: Movement driven by convective electrical current, due to translation of surface charge domains?
Other Observations of Self-organization (Water surface)
A. Wilson, D. Staack, T. Farouk, A. Gutsol, A. Fridman, B. Farouk, Plasma Sources Sci. Technol. 17 (2008), 045001.
LM 3 Ar 200 sccm (26.7 cm/s) Ar 250 sccm (33.3 cm/s) Ar 300 sccm (40.0 cm/s)
f [H
z]
20
25
30
35
5 6 7 8 9 10 11 12 13 14 15 16 17 18
0 50 100 1500
200400600
Ar 200 sccm, RF 6 W
a k [co
unts
]
fk [Hz]
LM3: Low frequency analysis
FFT, time sequence of 3800 optical emission spectra,
sampling frequency 300 Hzphoto-diode array (TranSpec 2000)
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13,1 13,2 13,3 13,4 13,528
29
30
31
650 700 750 8000
2000
4000
6000
ln(I
ijλA
-1 ijg i-1
) [
]
Εi [eV]
dy/dx=1/(kBT
e)
Ar I (772.3 nm)4p-4s
Ar I (750.4 nm)4p-4sAr I (696.5 nm)
4p-4s
I ij [
coun
ts]
λ [nm]
Ar I (667.7 nm)4p-4s
LM3: Detail Ar spectrum
Boltzmann method: approximation of the excitation temperatureNo exact real state of excitation equilibrium
Estimation of ‘Effective excitation temperature ’ as a thermodynamic plasma parameter reflecting the relative changes
Applicability of Boltzmann Method:
ne:1012 .. 1013 cm−3
Transition phase between LTE and
coronal phase:
Local partial excitation
saturation phase
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5 6 7 8 9 10 11 12 13 14 151600
1700
1800
1900
2000
2100
Ar flow 250 sccm
Te [
K]
RF power [W]
5 6 7 8 9 10 11 12 13 14 15200
250
300
350 Te [K]
16001700180019002000210022002300
RF power [W]
Ar
flow
rat
e [s
ccm
]
LM 3
85 Hz
78 Hz
45 Hz
LM3: Excitation Temperature
Effective excitation temperature Texc : - Correlates with operating characteristics of LM3- Increasing function of RF power
Regions of constant Texc : constant frequency f. Increasing f of LM3 : increase Texc. (also for other modes LMn)
Tex
c[K
]
Texc [K]
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Neutral gas temperature
� Measurement of the rotational states of OH provides approximation of gas temperature within micro channel
� Complementary temperature measurements in the gas flow (fluoroptic fibre probe and IR camera) validate the assumption of a local equilibrium between gas and surface of inner capillary
� Results:� Axial profile of gas
temperature� Decreasing Tg with
increasing flow rate
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Electron concentration
� Line Broadening of Balmer Hβ and Hγ� Gaussian profile: Instrumental broadening, Doppler broadening� Lorentzian profile: van der Waals broadening, electron imact
broadening (Stark broadening)
Broadened profiles of Balmer Hβ and Hγ. The intensitiesof the Gaussian and Lorentzian profilesare not calibrated.
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Crossing point method
Determination of electron concentration for given electron temperature.Application of GKS model and crossing point methodEstimation of electron concentration using the GC model applied on the measuredBalmer Hβ (J. Schäfer, et al, Eur. Phys. J. D 2010)
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Locked Mode
Discharge ignition:• Temperature gradients in the gas at the capillary surface, changed boundary conditions, • Development of a different flow profile, still stationary solution for SMn• Consumption of electrical power digitized (number of filaments)• Spending of excess energy, before additional discharge filament is evoked: achieved by
expansion of the ionization volume• Filaments become unstable, length increases, twisting and moving ends along the capillary• Response on the flow profile: Conservation of laminar flow, but with helical flow component
(laminar flow in tubes)• Vice versa, helical flow : stable solution for convective electric current trajectories• Filaments adopt the similar form - lock to helical flow regime.
Relation between axial gas velocity and radial velo city of the rotating filaments?
Observations
Discharges evolve strictly along the tube wall, prominent role of surface effects
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20 25 30 35 40
20
25
30
35
40
16 Wv ro
t [cm
/s]
vz [cm/s]
LM3 6 W 7 W 8 W
LM3: Correlation of axial gas velocity and radial filament velocity
Higher RF powers: radial velocity exceeds the average axial velocity of the gasIndication for a possible response of the discharge on the acceleration of the gas flow
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SiOx film with Locked Mode
-4
-3
-2
-1
0
1
2
3
0,2 0,3 0,4 0,5
-4
-3
-2
-1
0
1
2
3
0 20 40 60 80 100
binding %
Pos
ition
[mm
]
Si/O ratio
OO-Si-O O
O-Si-O O
108 106 104 102 100 98
0
500
1000
1500
2000
108 106 104 102 100 980
500100015002000250030003500
108 106 104 102 100 98
0500
10001500200025003000
Si(-O)4
Si(-O)
Si(-O)2
Si(-O)3
Cps
binding energy [eV]
Cps
Si(-O)4
Si(-O)3
Si(-O)2
Si(-O)
Cps
Si(-O)4
Si(-O)
Si(-O)2
Si(-O)3
Analysis Si 2p peak (Scanning XPS)
Lateral dependence of chemical Composition
C – free SiOx films:J. Schäfer, R. Foest, A. Quade, A. Ohl, K.-D. Weltmann, Eur. Phys. J. D 54 (2009), 211-217
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Fluid model of single filament
RF-excited plasma jet withrotating filamants
Model of fluid dynamics with preassumedplasma generation
approach 1
Model of plasma generation
Filament 1D Filament 2D with gas flow
approach 2
Fil. 3D
gas flowProduction and
transport of active speciesreactions at target surfaces
(deposition)
particle densities and fluxeselectric field, outer circuit
impact of gas flow
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Conclusion
• Locked mode - distinctive discharge regime of the RF APPJ with applicative potential for homogeneous and symmetric thin film deposition
• Systematic investigation of range of existence / operating conditions of the different locked modes depending on the number of filaments in the active zone
• Examination of LM 3 in Ar:
1. appearance of locked mode associated with increase of effective excitation temperature
2. positive correlation with rotation frequency of the discharge filaments3. (maximum: 35 cm/s, for gas flow velocity of 33 cm/s and RF power of
10 W)4. Determination of effective excitation temperature, rotational
temperature and electron concentration
• Supposition:1. Locked mode can be caused by coupling of the helical gas flow regime
and twisted filament propagation in the jet capillary.2. Establishment of the helical flow regime due to laminar conditions in
the capillary and due to symmetric disturbance of the boundary conditions of the gas flow at the wall with the moving filaments.
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Acknowledgement
Contributions:
J. SchäferH. LangeA. QuadeS. PetersF. SigenegerM. BeckerC. WilkeK.D. Weltmann
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Contact
Leibniz Institute for Plasma Science and Technology e.V.Address: Felix-Hausdorff-Str. 2, 17489 Greifswald Tel: +49 - 3834 - 554 300, Fax: +49 - 3834 - 554 301E-Mail: welcome@inp-greifswald.de, Web: www.inp-greifswald.de