HALT/HASS and Accelerated Testing Durability Growth through HALT/HASS and Accelerated Testing Elite Electronic Engineering.

HALT/HASS and Accelerated Testing

Durability Growth through HALT/HASS and Accelerated Testing

Elite Electronic Engineering


Topics Covered

Review Your Requirements Overview of Accelerated Stress Testing HALT

HALT Equipment, Test Methods, Expectations HASS Other Accelerated Tests Summary Q&A


Test Requirements & Goals

Is Testing Desired by Manufacturer to Reduce Cost of Development, Manufacturing, and Warranty Obligations?

Mandated by Manufacturer’s Client? What are your expectations and goals for

this testing?


New Product Development Testing Screens

Failure Modes

Qualitative Testing

Qualification Testing Qual Retest

Quantitative Testing Manufacturing Screen

New Product

HALT, HAST, ESD, Power Cycle, EMI RTCA DO-160

MIL-810, SAE J1455

Temp, Vibration, Shock, Waterproofness, Altitude, Humidity

HASSAnalysis Phase

Development Phase


Quantitative Testing

.95 .80

.98

.65

.98

Reliability Block Diagrams

=0.73

Success Run Testing

Test to Failure- Weibull


Which Tests To Run

Input from all departments Determine failure modes (FMEA) Consider complete life cycle of product Suggest stresses that will precipitate failures

Maximum Stress vs Time Dependent Develop test plan Execute test


Time Dependent Failure Mechanisms

Loss of signal Silicon Diffusion Temperature

Power Failure Dielectric Breakdown Electric Field

Loss of signal Electromigration Temperature & Power Cycling

Intermittent Output Corrosion & Oxidation of Fractures

Humidity, Voltage, Temperature

Loss of signal Dendrite Growth Humidity, Temperature

Water Intrusion Seal Leaks Pressure

Cracked Solder Joint

Fatigue Thermal cycling & vibration

Failure Mechanism Accelerating FactorsFailure Mode


HALT Testing (Qualitative)

Highly Accelerated Life Testing (HALT) Temperature and Thermal Shock (60C/min) Vibration 6 axis simultaneous (6 DOF) Very high stress levels to achieve time compression

& quickly find the weakest links. Additional stresses likely to precipitate flaws can be

used as a part of the HALT/HASS program. power cycling, voltage /electrical stress


HALT Testing

Design Optimization Provide data to designers for risk assessment Weak links- opportunity to improve the product before the design is “locked in”. Build in lifetimes of use in its field environment, “very large margins”. Proactive technique focusing on the mode and mechanism of failure, not on the

specifications or the level of stress. No pass/fail criteria HALT specification. Some HALT specifications describe a

“common method”

Product Comparisons Side-by-side evaluation of various products and product revisions under similar

extreme stress

HASS Endpoints Large margins enables the use of high levels of stress in the HASS screen. Leave

several if not many lifetimes of use remaining in the product. Enables the use of HASS to quickly detect any slippage that might occur in the

manufacturing process.


HALT Testing


HALT Testing

Halt Chamber Workspace

42”x42”x40”

Heating & Cooling -100C to +200C >60C/min depending

on product loading and temperature range


HALT Testing

Heating Elements Nichrome

Coils FLA 135A Min Service

175A 460VAC 3ph Airflow

4,000CFM


HALT Testing

LN2 Cooling 4.5GPM 30 PSIG


HALT Testing

RS Vibration Table Multi-axis repetitive shock 3 linear, 3 rotational Axes 2Hz-10,000Hz Up to 60GRMS

(depending on loading) Table Size 30” x 30” Payload up to 400lbs

(reduced vibration amplitude)

Compressed Air 90PSIG, 48CFM


HALT Testing

RS Impactors


HALT Testing


HALT Testing

HALT PSD

1.E-06

1.E-05

1.E-04

1.E-03

1.E-02

1.E-01

1.E+00

1.E+01

1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05

Frequency (Hz)G^

2/H

z


HALT Testing

Ckt board resonant frequencies

Components on PWB

Chip capacitors and die bond wires


Feb 11, 2005 10:23:11

Demand: 6.061 G

Control: 6.06 G

Level 1) 100%

Level Time: 0:05:00

Total Time: 0:05:22

Output: 0 V RMS

End of Test

Ice Corporation (33141)

De-Icing Control Unit (9510 Rev T)

Y Axis sn: C350-00057-SAC

20 2000100 1000-31x10

-21x10

-11x10

Demand

Control

Frequency (Hz)

Acceleration (G

²/H

z)

Acceleration Profile

RS vs. ED


RS vs. ED

ED (Electrodynamic Vibration) Controllable Vibration Spectra 5Hz-2000Hz Single Axis 2” Displacement

RS Random Only 6 Axis 30Hz-10,000Hz 10x -15x higher peak accel vs. ED


STEP 1: Pre-HALT Planning

Discuss product with multi-functional team Develop test plan Bench test to confirm operation before starting HALT

Steps Involved with HALT


HALT Process

STEP 2: Preparing for the HALT

Setup Design appropriate vibration fixture Tune chamber proportional & integral parameters Configure air flow for maximum product temperature

change rate Apply thermocouples and accelerometers to device

under test Setup functional test equipment


HALT ProcessSTEP 3: Thermal Step Stressing Cold

Begin at ambient Step down in 5°C or 10°C increments Use caution as fundamental limit is approached Approximate dwell time of 10 minutes at each temperature Allow sufficient time to run functional tests Find and fix failures Verify operation of thermal safeties Disable safeties to determine actual operating & destruct limits Continue until fundamental limit of technology is reached Practice continuous failure monitoring


HALT Process

STEP 4: Thermal Step Stressing Hot

Begin at ambient Step up in 5°C or 10°C increments Use caution as fundamental limit is approached Approximate dwell time of 10 minutes at each temperature Allow sufficient time to run functional tests Find and fix failures Verify operation of thermal safeties Disable safeties to determine actual operating & destruct limits Continue until fundamental limit of technology is reached Practice continuous failure monitoring


Limits Encountered in HALT

Stress

LowerOperating

Limit

Margin

Operating

ProductSpecs

LowerDestruct

Limit

Destruct Margin

UpperOperating

Limit

Margin

Operating

UpperDestruct

Limit

Destruct Margin

Data from Gregg Hobbs of Hobbs EngineeringData from Gregg Hobbs of Hobbs Engineering


HALT Process

STEP 5: Rapid Thermal Cycling

Transition temperature at maximum product temperature change rates

Select temperatures 5°C inside upper and lower operational limits Reduce change rate by 10°C/min if product cannot withstand

maximum rate Continue thermal cycling until operating limit (°C/min) is found Continue cycling for a minimum of 10 minutes Apply functional testing and continuous failure monitoring Depending on the product or application, this step is sometimes

omitted


HALT Process

STEP 6: Vibration Step Stress

Understand how product responds to vibration input Vibration is stepped-up in increments, normally 3-5

Grms on the product Dwell time of 10 minutes at each level is typically

sufficient Start dwell once product reaches vibration set point Continue until operational or destruct limit is found Apply additional product stresses during process


HALT Process

STEP 7: Combined Environments

Develop thermal profile Use established thermal operating limits, dwell times and change

rates Incorporate functional tests and continuous failure monitoring Begin with constant vibration level of approximately 3-5 Grms Step up in 3-5 Grms increments upon completion of each thermal

cycle Use tickle vibration when higher Grms levels are reached Add 3-5 Grms tickle to determine if failures were precipitated at

high G level but only detectable at lower G level


Suggested HALT Process Per GMW 8287


The Product Determines the Stress Power Cycling Output Loading Voltage/Electrical Stresses Humidity (HAST) Pressure Altitude Corrosion

Other Stresses


HALT Process

STEP 8: Lessons Learned

Determine root cause of all failures that occurred Meet with design engineers to discuss HALT results Management cost justification & risk assessment Determine and implement corrective action Perform Verification HALT Insure problems are fixed and new problems were not

introduced Periodically evaluate product as it is subjected to engineering

changes


HALT Testing

Other considerations Quantity of Samples

Product Improvement Preparation for HASS/HASA Comparison Testing

Fixturing Stimulation vs. Simulation

Product and Fixture Weight Test Uniformity

LowerOperating

Limit

Margin

Operating


HALT Testing

Cross Table Uniformity

69.364.0

45.2

60.065.5

136.3130.0

93.3

128.4

136.1

17.9

12.9

10.8

14.7

16.3

0.0

20.0

40.0

60.0

80.0

100.0

120.0

140.0

160.0

1 2 3 4 5 Table Location

25 &

55

Grm

s In

pu

t S

cale

0.0

5.0

10.0

15.0

20.0

25.0

5 G

rms

Inp

ut

Sca

le

25 Grms Input55 Grms Input5 Grms Input


HALT Testing

Response Level

Test Location Control Level Grms- X Grms-Y Grms-Z Mean

1 5 21.2 19.2 13.4 17.9

1 25 79.8 73.0 55.0 69.3

1 MAX (55) 158.1 138.3 112.6 136.3

2 5 14.2 14.6 9.8 12.9

2 25 73.3 68.4 50.3 64.0

2 MAX (55) 150.1 134.2 105.6 130.0

3 5 10.5 13.8 8.1 10.8

3 25 42.6 55.6 37.3 45.2

3 MAX (55) 85.5 113.6 80.7 93.3

4 5 16.6 17.4 10.1 14.7

4 25 68.1 67.5 44.5 60.0

4 MAX (55) 145.3 140.3 99.7 128.4

5 5 19.1 18.4 11.3 16.3

5 25 77.1 69.5 50.0 65.5

5 MAX (55) 157.4 140.5 110.5 136.1

1 5 20.5 17.9 12.1 16.8

1 25 75.1 72.3 51.9 66.4

1 MAX (55) 158.1 140.7 112.8 137.2


HALT Testing


HALT Testing


HALT Testing


HALT Testing


HALT Testing

Failure Analysis Services


HALT Testing

“SEM photographs showing and overall view (top, ~40x) and a typical closer view (bottom, ~800x) showing some surface debris but no damage to the integrated circuit from sample D4.”

Failure Analysis Services


HALT Testing


Component Selection Did vendor perform HALT AND HASS? Use to verify products operating limits. Use to select most robust product.

Vendor Selection If subcontracting, vendor needs to meet your

standards (Halt and Hass equipment, should be the same.)

Other Uses of HALT


HASS- Highly Accelerated Stress Screening

HASS is used as a production quality screen quickly identify any weaknesses that might enter the

product due to changes or malfunctions in the manufacturing process.

Each weakness detected, represents an opportunity to take corrective action prior to shipping large quantities of flawed product.

The screen is “tuned” so that it detects weak product while still leaving several, if not many lifetimes of field use in the shipped product.


HASS Testing

HASS- 100% Production Screening HASA- 1-10% Production Auditing Safety of of HASS

Repeat screen a minimum of 20 times Assuming remove less than 5% life Failures after less than 10 times, too harsh

Re-HALT- Confirm margins


Other Accelerated Stress Testing

Acceleration Factors Temperature

Arrhenius Model Humidity

Arrhenius-Peck Model Vibration

Miner Criteria Voltage

Inverse Power Law Product Life Cycling

CALT Testing Test to Failure & Apply Weibull Analysis


Product Life Cycling

Calibrated Accelerated Life Testing (CALT) Suggest primary fatigue mechanism Simulate loads at three stress levels

90% of foolish load (first test) 80% of first test load Third stress level

Depends on first two and ultimate life Test all units to failure Plot S-N curve, Determine AF’s Generate Weibull Plot


Product Life Cycling

Accelerated Life Testing

•“Accelerated Testing: Statistical

Models, Test Plans, and Data Analysis”

•By Wayne Nelson

•CALT GMW 8758

•Example

Automatic Lubricating System


CALT Test Example

•Simulate loads at three stress levels

•Monitor test counting cycles to failure


CALT Test ExampleStress Cycles To Failure

36 312136 107536 62936 945231 1138631 110431 662431 157725 1104425 1540525 1925725 28723

Pump S-N Curve

y = 3050953219559.39x-5.93

100

1000

10000

100000

10 100Applied Stress (PSI)C

ycle

s to

Fai

lure

•Collect Failure Data

•Plot and determine Inverse Power Relationship

•AF = (Saccel/Snormal)b

Determine AF'sConditionHigh StressMid StressConfirm StressNormal Stress

Accel Factor1807421

Stress Value (PSI)36312515 N/A


CALT Test ExampleStress Level Test Stress Accel Factor Rank

High (IG) 3121 180 9High (IG) 1075 180 4High (IG) 629 180 2High (PP) 9452 180 12

Medium (PP) 11386 74 11Medium (IG) 1104 74 1Medium (PP) 6624 74 8Medium (IG) 1577 74 3Confirm (PP) 11044 21 5Confirm (PP) 15405 21 6Confirm (PP) 19257 21 7Confirm (PP) 28723 21 10

Cycles at Normal Stress5609791932241130591698933

398246594009

84318981757490540116785228397318585

Median Rank5.6113.6021.6729.7637.8545.9554.0562.1270.2478.3386.4094.39

81757

228397

594009843189

1698933

Sorted Least to Most (Resort these numbers for each

change to spreadsheet)

318585398246490540560979

113059116785193224

Sort and apply median ranks Generate Weibull Plot


CALT Test Example

Weibull Plot

•Obtain distribution parameters

•Reliability metrics

•B1, B10

•Reliability vs life

•Reliability Block Diagrams

ReliaSoft Weibull++ 7 - www.ReliaSoft.comProbability - Weibull

Time, (t)

Un

reliab

ilit

y, F(t)

10000.000 1.000E+7100000.000 1000000.0001.000

5.000

10.000

50.000

90.000

99.000Probability-Weibull

Data 1Weibull-2PRRX SRM MED FMF=12/S=0

Data PointsProbability Line

Steve LayaElite Electronic Engineering6/12/20084:58:49 PM


HAST TestingAccelerated Humidity Testing

•HAST (Highly Accelerated Stress Testing)

•JESD22-A110 B

•Compress 1000 Hour 85/85 Humidity to 96 Hours

•High Temperatures may stimulate uncorrelated failures

•Arrhenius-Peck Accelerated Model for Temperature Humidity


HAST Testing

“…Photographs showing environmental damage to the solder joints of A8.”


Instrumentation & Data Acquisition

Yokagawa DL708 Scope Ten Systems In-House 4, 8, and 16 Channel

LeCroy Digital Storage Scopes 1.5GHz Bandwidth, 8GS/s, 16M data

points Seven Systems In-House

400MHz, 500Mhz scopes

Agilent 34970A Data Acquisition System 120 Single Ended or 60 Differential Input AC/DC, Volts, Amps, Frequency, Ohms


Advanced Material Center

Materials Testing and Failure Analysis Physical Testing Thermal Testing Chemical Testing Light & Appearance Exposure Testing Product Comparisons

Location: Ottawa, Illinois

www.amc-testlabs.com



Physical Testing Tensile Tear Dart Flextural Friction Surface Tension Specific Gravity Density COF



Thermal Analysis Differential Scanning Calorimeter

(DSC) Melt range Purity

Thermal Mechanical Analyzer (TMA) Expansion/Contraction

Thermal Gravimetric Analyzer (TGA) Thermal degradation Ash


Materials Engineering Incorporated

Complete Metallurgical Laboratory Failure Analysis Analysis of Processing Problems Contamination Identification Engineering Support/Consulting Laboratory Testing Specialized Testing Litigation Support and Expert Testimony

Location: Virgil, Illinois

www.materials-engr.com


Materials Engineering Incorporated

Complete Metallurgical Laboratory Scanning Electron Microscope (SEM) with EDS OES Chemical Composition Metallography and Microscopy Microhardness and Hardness Electrical Conductivity Density/Specific Gravity Surface Roughness (Ra) Pressure and Torque Testing Specialized Product and Component Testing ISO 17025 Accredited by A2LA


Other Tests to Failure


Other Tests to Failure


Durability Growth to HALT HASS

Any Questions?

Thank You!

HALT/HASS and Accelerated Testing Durability Growth through HALT/HASS and Accelerated Testing Elite Electronic Engineering.

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