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8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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TABLES
FOR
ONE-SIZED
STATISTICAL
TOLERUCE
LIMITS
Z:::J.BY
Z~GERALD
J.
LIEBRM
TECHNICAL
REPORT
NO.
34
NOVEKBER
I,
1957
PMEARE
UNDER
CONTIRACT
N6onr
-25126
GERALD
J, LIKEKAN,
PROJRT
DIRECT'OR
FOR
OFFCR
OF
NAVAL
R
ACH
REPOUTION
IN WHOLE OR IN PART
IS
KI1TKD
FOR
ANY
rURPOSE
OF
THE
UNITED
STATE
APPLIED
MATHD(ATICS
AND STATISTICS
LABORATORY
STANFORD
UNIVERSITY
STANFORD,
CALIFORNIA
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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.-
1,
-
.-
\
.
"
.
,. ,.q
TABLES FOR ONE-SIDED STATISTICAL TOLERANCE
LIXITS
by
Gerald
J.
Lieberman
'A
1.
INTROUCTION.
The
quality
of
manufactured
product is often
specified
by
setting
a range,
the bounds
of
which are
called
tolerance
i ts.
These
limits
have
the
property
that a
certain
percentage,
00(]-a)
% , of
the
product
may
be
expected
to fall
within
these limits.
If
the
quality
of the items
is
normally
distributed
with known mean,
14
and
known
standard
deviation,
a , two-sided tolerance
limits
are
formed by
adding
to and subtracting
from
p
he quantity
K
a' , where
K2
is the normal
deviate
corresponding
U 22
to
a/2
.
An
upper
one-sided tolerance
limit Is
given
by p + K or
and
a
lover
one-sided tolerance
limit is
given
by
p- K
a
. Unfortunately,
In
a
practice,
the values
p
and
a, are
rarely
known
and
estimates
of these
A
values,
- and a
,
respectively,
are used.
However,
where before it
could
be
stated
that 95
of a manufactured
product
lies
below
1 + .64 a
the
upper one-sided
tolerance
limit,
this
statement
cannot
be
extended to
the limit
i + 1.645
a
. The quantities
i and
s
arp
random
variables,
and hence the
limit
depends
upon
the
particular
outcome
of
the sample.
Different
samples
will lead to
different
limits. How
close thebe
11mit
are to
u +
1.645 a
depends
upon how
good
the
estimates
are.
It
is evidnt
then
that the fraction
of
the ;tems
lnc'u,&ed
bet.--,r
A,,
A~
-
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-
~;
-2
",a. t -K., ,
i
+
K
a.,s
for two-sided tolerance
limits,
b. - o, +
K
]
for an upper
one-sided
tolerance
limit,
c. Ix- Kas , co]
for a lower
one-sided
tolerance limit
will not
always contain a specified
proportion I- of
the
manufactured
items. However, it is
possible to determine constants K such
that in a
large series of samples from
a normal distribution, a
fixed
proportion
7
of
the
int(
rvals
a. [-Ks, +
Ks
]
for two-sided tolerance
limits,
b.
[- ;0,+ Ks] for an upper one-sided tolerance limit,
and
-c. -
Ks,
co]
for a lower one-sided tolerance
limit
will
include
100(1-a)%
or
more of the distribution.
The
finite
limits
of
these intevals are known as statistical tolerance limits. Thus, an
upper
one-sided
statistical
tolerance limt is given by
x +
Ks and has
the property that the
probability is
equal
to a
preassigned value
7
that
the
interval
[-
co,
i
+
Ks]
includes
at least a
specified proportion
1
-
a
of
the distribution.
Note
that
in
most practical situations
y
is
usually
a
large number close to 1 . Statistical tolerance intervals
should not be confused
with confidence intervals for a
parameter of
th e
distribution. Confidence limits
for the mean of a normal distribution
are
such
that in a given fraction, say
.95
,
of
the samples
from which they
are computed, the interval bounded by
the
limits
will include
the
true mean
of
the
distribution. For confidence interval
estimation,
.95
is a lso
called the confidence coefficient.
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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Many
extensive
tables
of
factol-i
K
for
two-sided
o~lera~n:e limits
have
been
computed.
A. R.
Bovker
presents
such a table
in
[1)
and
very
recently A.
Lieberman issued
a set of tables [2)
which
are
an extension
of Bowker's tables in
that they can be used when s
is computed from saple
si~es
other
than n . Resnikoff
33 and
JMitra (14)
computed values of
K when a
Is
estimated by
the average
range
of
subgroups. Tables
of
factors
K for
one-sioe.
tolerance
limits
have
never
been conputed anid
It
is
the
purpose
of
this
paper
to
present
such
tables.
2.*
TABfL OF
ONE-SIDED T01 ACE
LIM.
Factors
K such
that
i+ Ku
and
-Ks
are
an
upper
one-sided
tolerance
limit
and
a
lower
one-sided
tolerance
limit,
respectively, for
a
normal universe
are given
in Table
1
for
n
a3,2d,...,2530,354,245,50;
for
Y
a 0.75,
0.90, 0.95,
0.99; and
for
Q
a 0.25, 0.1000.05,0.01..0.001
iis
the
sample
mean
a
(x
1
+ x',
x.. /n )
and a
is the
sample
st~zdard
deviation
a __( )2
+ (x2- ) + .+(Xn
)
2
/(n-l).
For
n greater
than 50
the values
of K can
be obtained
using the
asymptotic
normality
property of x+
Ks .
With tLhis approximation,
K
is
given
by
K
a
a
where
K'~
a 1
K
2
.... .-.
..
. .
. . .
. .1
- b
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. . . 3CM .
1-.. 4.
-4--
and K and
K (which
equals -K,
that
2
)
are th e
a
-7 7
normal deviates
corresponding
to a and 7
respectively,
i.e.
o-1
2
00
1
2
fe
nds dz -,
7
3.
.XAMPLZ.
A
mnufacturer of light
bulbs would like to specify a single
lower
limit above which he can be assured, with probability
0.95 , that
at
least
99 of his
production
will
lie. A
sample
of
30 bulbs
is taken
and the sample mean and sample standard
devir.tion
are
found to be
987.2
and 5
963
respectively. A value
of
K a
3.064 corresponding
to
a
- 30
7 a 0.95 and
a
a 0.01 is
obtained from Table
1 . The required lower
tolerance
limit
is given by
- Ks -
987.2
- (3.064)(5.963)
-
968.9
4
C0TRT
ION
OF
TRE
TAM.U
For
the
case of a normal distribution
with wkziown parameters
P
and w
,
exact
one-sided tolerance limits
my be
computed by the follow-
ing
procedure.
Let ta -
1
,
IS %
be a
non-central
t statistic with
n-i
degrees
of freedom and non-etrality parameter
n K .
K is
aa
defined
by
2
S e-
Z
dz -a
Determine
t
0
such that P tn
K > t
1
- '
Let
K
- to/ /'-. Then
if i and s
are the
sample
mean
and
the sample
standard
deviation, respectively,
bae. on
a sample
x ,x ,.
.V
n
.e
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-2
%
X
2
_ _i
x=
-
and
s
n
n
n-i
i
+
Ks
and x
-
Ks are
upper
one-sided
tolerance
limit
and a
lower
one-sided
tolera-ice
limit,
respectively
Thus,
the
probability
is
y that
.
at
least a
proport on
l-a
of the
distribution
will be
less
than
x
+
Ks
(or greater
than
x
.. Ks
)
The value
t
o
may be
obtained
from tables
of
the
distribution
of the
non-central
t
sta'clstic.
Such tables
are
those of
Johnson
&
Welch [5]
and
Resnikoff
and
Lieberman
[6]. The
latter
tables
are perhaps
more
convenient
for
thiv application,
and
were
used
in the computation
of Table
1.
2
:i
I
-p.
.1
---------.--
p~ .
.
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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TABLE
1.
Tolerance
Factors
for
Normal
Distributions
Factors
K
such
that
the
probability
is
7
that
at
least
a
proportion
-a
of
the
distribution
will
be
less
than
x +
Ks
(or
greater
than
x
-
Ks),
where
i
and
s
are
estimates
of
the
mean
and
the standard
deviation
com-
puted
from
a sample
of
size
n
7
-
0.75
I
7
- 0.90
['-Cr-0.25
0.10 0.05 0.01 0.001
0.25
0.10 0.05 0.01
0.001
3
1.464
2.501
3.152
4.396
5.805
2.602
4.258
5.310
7.340
9.651
4
1.256
2.134
2.680
3.726
4.910
1.972
3.187
3.957
5.437
7.128
5
1.152
1.961
2.463
3.421
4.507
1.698
2.742
3.400
4.666
6.112
6
1.087
1.860
2.336
3.243
4.273
1.540
2.494
3.O91
4.242
5.556
7
1.043
1.791
2.250
3.126
4.118
1.435
2.333
2.894
3.972
5.201
8 1.010
1 740
2,190
3.042
4.OO8
. 1.360
2.219
2.755
3.783
4.955
9
0.984
1.702
2,141
2
977
3.924
1.302
2.133
2.649
3.641
4.772
1o
0.964
1.671
2.103
2,927
3.858
1.257
2.065
2.568
3.532
4.629
11
0.947 1.646
2.073
2.885
3.8c4
1
219
2.012
2.503
3.444 4.515
12
0.933
1.624
2.048
2.851
3.760
1.188
1.966
2.448
3.371
4.420
13
0.919
1.606
2.026
2.822
3.722
1..162
1.928
2.403
3.310
4.341
14
0.909
1.591 2.007
2.796
3.690
1.139
1.895
2.363
3.257
4.274
15
0.899
1.577
1.991
2.776
3.661
1.119
1.866
2.329
3.212
4.215
16
0.891
1.566
1.977
2.756
3.637
1.101
1.842
2.299
3.172
4.164
17
0.883
1.554
1.964
2.739
3.6 r-
1.085
1.820
2.272
3.136
4.118
18 0.876
1,544 1.951 2.723
3.595 1.071
1.800
2.249
3.106
4.078
:19
0.870
1.536
1.942
2.710
3.577
1.058
1.781
2.228
3.078
4.O41
i20
0865
1.526
1.933
2.697
3.561
I.o46
1.765
2.208
3.052
4.009
21
0.859
1.520
1.923
2.686
3.545
1.035
1.750
2.190
3.028
3-979
022
851,
1.514
1.916
2.675
3.532
1.025
1.736
2.174
3.007
3.952
23 0.849
1.508
1.907 2.665
3.520
1.016
1.724
2.159
2.987
3.927
24
0.845
1.502
1.901
2.656
3.509
1.007
1.712
2.145
2.969
3.904
25
0.842
1.496
1.895
2.647
3.497
0.999
1.702
2.132
2.952
3.882
S3
0.825 1.475
1.869
2.613
3.441
0.966
1.657
2.c80 2.884 3.794
35
0.812
1.458
1.849
2.588
3.421
0.942
1.623
2.041
2.833
3.730
40
0.803
1.445
1.834
2.568
3.395
0.923
1.598
2.010
2.793
3.679
45
0.795
1.435
1.821
2.552
3.375
0.908
1.577
1.986
2.762
3.638
. 0 788
1.426 1.811 2,538
3.358 ,894 .56G
1.965 2 73c 3.604
iT-4
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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t
--7.
TkA=L
1.
Tolerance
Factors
for
Normal
Distributions
(continued).
7 -
0.95
7
-
0.99
\i
0.25
0.10
0.05
0.01
0.001
0.25
0.10
0.05
0.01
0.001
3
3.8C14
-.
.
7.655
10.552
13.857
4
2.619
4.163
5.145
7.o42
9.215
5
2.149
3.4o7
4.202
5.741
7.501
6
1.895
3.006
3.707
5.062
6.612
2.849
4.4o8
5.409
7.334
9.540
7
1.732
2.755
3.399
4.641
6.o61
2.490
3.856
4.730
6.411
8.348
8
1.617
2.582
3.188
4.353
5.686
;Z
52
3.496
4.287
5.811
7.566
1.532
2.454
3.031
4.143
5.414
2.085
3.242
3.971
5.389
7.0]4
10
1.465
2.355
2.911
3.981
5.203
.954
3.048
3.739
5.075
6.603
11
1.411
2.275
2.815
3.852
5.036
1.854
2.897
3.557
4.828
6.284
2
1.366
2.210
2.736
3.747
4.900
1.771
2.773
3.41o
4.633
6.032
13
1.329
2.155
2.670
3.659
4.787
1.702
2.677
3.290
4.472
5.82b
14
1.296
2.108
2.t,14
3.585
4.690
1.645
2.592
3.189
4.336
5.651
15
1.268
2.068
2.566
3.520
4.607
1.596
2.521
3.102
4.224
5.507
6
1.242
2.032
2.523
3.463
4..534
1.553
2.458
3.028
4.124
5.374
17
1.220
2.001
2.486
3.415
4.471
1.514
2.405
2.962
4.038
5.268
13
1.200
1.974
2.453
3.370
4.415
1.1481
2.357
2.906
3.961
5.167
19
1.183
1.9149
2.423
3.331
4.364
1.450
2.315
2.855
3.893
5.078
1.167
1.926
2.396
3.295
4.319
1.424
2.275
2.807
3.832
5.003
21
1.152
1.905
2.371
3.262
4.276
1.397
2.241
2.768
3.776
4.932
122
1.138
1.887
2.350
3.233
4.238
1.376
2.208
2.729
3.727
4.866
23
1.126
1.869
2.329
3.206
4.204
1.355
2.179
2.693
3.680
4.806
24 1.114 1.853
2.309
3.181
4.171
1.336
2.154
2.663
3.638
4.755
25
1.103
1.838
2.292
3.158
4.143
1.319
2.129
2.632
3.6ol
4.706
3C
1.059
1.778
2.220
3.064
4.022
1.249
2.029
2.516
3.446
4.508
35
1.025
1.732
2.166
2.99'.
3.934
1.195
1.957
2.431
3.334
4.36,.
40
0.999
1.697
2.126
2.941
3.866
1.154
1.902
2.365
3.2'0
-..
2
5
45
0.978
1.669
2.092
2.897 3.811
1.122
1.857 2.313
3.181
4.168
50
0.961
1.646
2.065
2.863
3.766
1.096
1.821
2.296
3.124
,.0
9
6
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~-8-
BIBLIOGRAPHY
[i
Bowker,
Albert
H.,
"Tolerance
Limits
for
Normal
Distributions,"
Techniques
of
Statistical
A
edited
by
Eisenhart,
Hastay
.
and
Wallis,
McGraw-Hill,
New
York,
1947,
Chapter
2.
12)
Lieberman,
Alfred,
"Table
for
the
Determination
of
Two-sided
Tolerance
Limits
for
the
Normal
Distribution,
Report
No.
373-17(55), Bureau
of
Ships,
Navy
Department,
Washington
25,
D.C.,
20
August
1957.
(33
Resnikoff,
George
J.,
"Two-sided
Tolerance
Limits
for
Normal
-
Distributions
Using
the
Range,
Technical
Report
No.33,
Applied
-
Mathematics
and
Statistics
Laboratory,
Stanford
University,
California,
April
25,
1957.
41
Mitra,
S.
K.,
"Tables
for
Tolerance
Limits
for a
Normal
Pcpulation
*
-Based
on
Sample
Mean and
Range
or
Mean Range,"
Journal
of
th e
American
Statistical
Association
March
1957.
(5]
Johnson,
N.
L.,
and
Welch,
B.
L.,
"Applications
of
the
on-central
t-
Distribution,"
Biometri
Vol.
31,
(1940),
Pp. 362-389.
L61
Resnikoff,
George
J.,
and
Lieberman,
Gerald
J.,
'"ables
of
the
Son-central
t-
Distribution,
Stanford
University
Press,
Stanford,
California,
(1957),
pp
736.
0.
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-'..
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Technical
Reports
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Contract
N6onr-2512
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P.
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(OCCQA)
Dallas Air
Procurewnt District
5555 S.
Archer
Avenue San
Antonio Air
Materiel
Area
Chicago
38,
Illinois
Attn: Quality
Control Division
Attn:
Peter K. Kuffner
1 Wilson Building
-
Roca
338
Dallas
1, Texas
Chief
Arizona Air Procurement
District Chief
San
Bernardino Air Materiel Area
rayton
Air Procurement District
Attn: Quality Control
Division
Mobile Air Materiel
Arei
P.
0.
Box
5555 Attn: Quality Control
Divisin
Helen
Street Annex
Building 70
- Area G
-ucson,
Arizona
right-Patterson
Air Force Base
Ohic
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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SChief
chief
L-''Detroit
Air
P)
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fnt
Distriet
Rochesret-
Air
Procurement
District
4obile
Air
Materi,
Area
Middle
o
A
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Materiel
Area
Attn:
quality
Control
Division
Attn:
Qwlity
Contr-J.
Division
W,
1
rren
Ave.
&
TOnyo
Blvd.
20
S
ylingtov
. ace,
P.
0.
Box
1669
Detroit
32.
Michitan
Rocheeter
3,
New
Yor;L
Chief
Indianapolis
Air
- ocurentt
District
Di ti
Mobile
Air
Materlel
Area
Oklahoma
City
Aii,
Materiel
Area
Attn:
quality
Cotrol
Division
54
Monument
Cire:e
.~td~o
,, 10.ia~.
U14
Mar, Street
St.
Lovf
,
Missouri1
Chief
Chief
LAs
Angeles
Air
Orocureaent
District
SAi
e&c
Ir
Procuremat
District.
San
Ben~r-no
.r
Matertel
Ar
.a
San
..
.
Air
teriel
Area
*.At:Quality
Control
D-,vision
Att~r:
-A
,tY
Cnt-.o1
Divisionendix
Building
P.
0.
IOx
1I' .
1206
8
Mple
Street
'.,id
8m.
Diego
;3.t.
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',-
..,
;
Angeles,
California
3
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.
,;hwiy
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Diego
10,
(clifornia
m.
kee
Air
Procurtmnt
Dijtrict
Chief
Oklahoma
City
A'
Materiel
Ara
San
Francisco
Air
PrOeuremont
District
ttn:
Quality
Control
Division
Sacra.wnto
Aiv
'
iLerlel
a-ftr
70
D.
Plankinton
Aventv
Attn: Quality Control Division
2-.Milw~aukee,
Wisconsin
151.5
Clay
S re
Chief
Okkland
12p
California
c .
iNewark
Air
Procurement
Distrl
Chief,
Bureau
of
Aeronautics
Middletown
Air
Materiel
Area
Department
of
t~.e
Navy
Att.:
Quality
Control
D,-visich
Wshington
25,
D.
C.
'(3;
;
Mi
r*';et Street
Wsigo
5
.C
- '.' '.
Attn:
Q4Ality
Control
Division
Newark,
New
Jersey
C
Chief..
Bureau
or
Ordnance
hief
quality
Control
Division,
QCC
New
York
Air
Procurement
Distrint
Department
of
the
Navy
iddletown.
ir
W*'eriel
Are,
Washington
25,
D.
C.
Attn:
QuAlity
Liz:
Divibion
Wsigo
5
.C
last
16th
Stetn
Attn:
Dr.
W.
B.
Pabst
l
East
16th
Street
Mr.
if.
34.
Rosenblatt
3
New
York 3,
New York
r
Chief,
Bureau
of
Ship8
hief
Research
and
Dev.
Division,
Philadelphia
Air
Procurement
District
Code
373
Middletown
Air
Materiel
Area
Department
of
the
Navy
Attn:
Quality
Contr,.
Division
Washington
25,
D.
C.
6
I1
'Walnut
Street
Philadalphia
2,
Pennsylvania
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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Chief of
Naval Materiel
Cora,,der
Code M533,
Room 2236
14
dletown
Air
Materiel Area
Main Navy Bldg.
Olmsted
Air
Force
Base
Washington 25, D.C. 1 Middletown, Pa.
Attn.
MAPQc
Chief of
Naval
Operations
Operations
Evaluation Group Commander
he (OP-3g)
U.S.
Naval
Ordnance
Test
Station
The Pentagon
China Lake, Calif.
Washington 25,
D.C.
1
Attn: Technical Library
Chief of Ordnance Commander
U. S. Army
U.S.
N.O.T.S.
Research
and
Developmert Division Pasadena Annex
Washington
25, D.C. 3202 E.
Foothill Blvd.
Attn: Brig. General L.E. Simon 1 Pasadena 8, California
Mr. Charlea Bicking 1
Commander
Chief, Procuremen t-Maintenance
U.S.
Naval Proving Ground
Engineering Division
Dahlgren,
Virginia
Fort Monmouth,
New Jersey
Attn: Technical Library
Attn.
Procurement Data Branch
SIGEL-PP-l 1
Commander
Middletown
Air
Materiel Area
Chief,
Quality Control Branch Attn:
Quality
Control Office
Artillery Ainunltion Dept. Olmsted Air Force Base
Inspection Engineering Division Middletown, Pennsylvania
1
Frankford
Arsenal
Philadelphia
37, Pa. 1 Commander
Middletown Air Materiel Area
Chief,
Statistical Engleering Lab.
Attn:
Quality
Control
Dlvi-
National Bureau of
Standards
sion-Directorate
of
Washington
25,
D.C.
1
Procurement
&
Production
Cleveland Air
Procurement District Olmsted Air
Force
Base
1279
West Third
Street
Middletown, Pennsylvania
Cleveland
13,
Ohio
Attn: Quality Analysis Section
1
Commander
?-iddletown Air
Materiel
Area
Chief, Bureau of Yards and Docks Attn: Assistant for Quality
Materiel Division
Directorate
of
Maintenance
Dept. of the Navy Engineering
Washington 25, D.C. Olmsted
Air
Force Base
Attn: Mr. W. Wolman 2 Middletown, Pennsylvania
1
Commander Commander
Air
Technical Intel igence
Center Middletown Air Materiel
Area
Attn: Myron
A. tengoff
(AnOIN-4cI) Atta.
Materiel
Quality
Division
Wright-Patterson
Ala
Force Base
Directorate
of Supply
Ohio
1 and
Services
Olmsted
Air Force
Base
Midlletown,
P-nn6ylvir. ti
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-iv-
Commnder
el.-,zander
Mobile Air
Materiel
Area
Oklahom&
city Air Materiel
Area
Attn: Quality Control Office Attn:
Materiel
Quality Division
Brookley Air Force Base
Directorate
of
Supply and
Alabama Services
Tinker
Air
Force
Base
Commander
Oklahoma
City,
Oklahoma
AMobile
ir Materiel
Area
:.,.,.Attn:
quality
Control Division
Commader
-. :Directorate of Procurem|ent
Ogden
Air Materiel Area
S&Production
Attn:
quality Control
Office
Frookley
Air
Force
Base
Hill Air Force
Base
,
Alabam
Utah
Commander
Commander
Mobile
Air Materiel
Area
Ogden
Air
MaTczC.el
Area
Attn: Assistant
for Quality
Attn: Quality Control
Division
Directorate
of
Maintenance
Directorate
of
Procurement
Engineering
& Production
Brookley Air Force
Base
Bill
Air Force Base
Alabama
Utah
Coinsnder
Commander
Mobile
Air Materiel Area
Ogden Air Materiel Area
Attn: Materiel Quality Division Attn:
Assistant
for Quality
Directorate of
Supply
and
Directorate of
Maintenance
Services
Engineering
Brookley Air Force
Base Hill
Air
Force Base, Utah
1
Alabama 1
Comander
Cozander
Ogden Air
Materiel
Area
Oklahoma City
Air
Materiel Area
Attn: Materiel Quality Division
Attn: Quality
Control
Office
Directorate
of Supply and
Tinker Air
Force Base
Services
Oslahoma
City,
Oklahom 1 Hill
Air Force Base,
Utah
Conmander
ComwAnder
Oklahoma City Air
Materiel Area San
Antonio
Air Materiel
Area
-ttn:
Quality
Control
Division
Attn:
Quality
Control Office
Directorate of
Procurement
Kelly
Air Force
Base,
Texas
&
Production
Tinker Air Force Base
Commander
Oklahoma City, Oklahoma 1
San
Antonio
Air Materiel
Area
Attn:
Quality
Control Division
Commander
Directorate
of
Procurement
Oklahoma City
Air
Materiel
Area
& Production
Attn:
Assistant
for
Quality
Kelly
Air
Force
Pase,
Texas i
Directorate
of
Maintenanre
bigineering
Comnder
Tinker Air Force
Base
San Antonio
Air Materiel Area
Oklahoma
City,
Oklahoma 1 Attn:
Assistant for Quality
Direitorate
of
Maintenance
Engineering
Kelly
Air Force Base, Texas
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L
'
X
.
Com.ander
Commander
San
Antonio Air Materiel
Area Sa-ramento
Air
Materiel
Area
Attn:
Materiel quality Division Attn: Assistant for
Quality
Directorate
of Supply
ani
Directorate
of Maintenance
Services
Engineering
Kelly
Air Force
Base, Texas 1
McClellan
Sr
Force
Base
California
Commnder
San Bernardino
Air Materiel
Area
Comader
Attn: Quality Contrul
Office
Sacramento kir
Materiel
Area
Norton Air
Force Base
Attn:
Materiel
Quality
Division
California 1
Directorate of Supply an d
L
Services
Comder
McC'ellan Air Fc,
eie
San
Bernardino Air kateriel
Area (alifor'
i
Att" Quality
Control Division
Directorate
of
Procurement
Coumandee
& Production
Warner Robin
Air Materiel Area
Norton Air Force
Base
Attn:
Quality
Control Office
California
Robins Air
Force
Base
ComziderGeorgia
Commander
San
Bernardino
Air
Materiel
Area
Conmander
Attn:
Assistant for Quality
Warner
Robins Air
Materiel Area
Directorate
of
Maintenance
Attn: Quality
Control Division
Engineering
Directorate of Procurement
Norton
Air
Force
Base &
Production
"
California
Robins Air Force
Base
Georgia
Comnmder
San
Bernardino Air
Materiel
Area
Commander
Attn:
Materiel
Quality Division
Warner Robins
Air Materiel
Area
Directorate
of Supply and
Attn: Assistant
for Quality
Services
Directorate of Maintenance
Norton Air
Force
Base
Engineering
California
Robins Air Force
Base
Georgia
Comander
Sacramento
Air Materiel
Area
Comander
Attn:
Quality
Control
Office
Warner
Robins Air Materiel Area
McClellan Air Force Base
Attni
Materiel Quality Division
California
1
Directorate
of
Supply and
Services
Commnder
Robins Air Force Base
Sacramento Air Materiel
Area
Georgia
Attn:
Quality Control
Division
Directorate
of
Procurement
& Production
McClellan
Air
Force Base
California
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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,.
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-vii.
Commander
-umader
Maywood
Air
Force Depot
4
,ain
Air Materiel
Area
Chell Air Force Station Attn: uality Control Office
Attn: Directorate of Supply & APO 28i
Services
New
York, New York
P. 0. Box 310
Maywood,
L. A.
County
Comander
Cal ifornia 1
Air
Materiel Command
Attn:
Quality
Control
Office,
MCQ
Comander
Wright-Patterson Air Force
Base
Air
Materiel
Force,
European Area
Ohio 10
Attn: Quality Control Office
APO
633, New York, New
York
1 Comaunder
San Antonio
Air
Materiel
Area
Commander
Attn: Quality
Control
Division
Northern
Air Materiel
Area,
Europe
Directorate Special Weapons
At-tn:
Quality
Control
Office
Kelly
Air Force Base,
Texas
APO
12h,
New York, New York 1
Chief, Bureau of Ordnance
Commander Attn: A.
Rothstein,
Code REVg
Central
Air
Materiel Area,
Europe
Department of Navy
Attn: Quality
Control Office
Washington 25, D.
C.
APO 10,
New York, New York 1
Commanding General
Comander
Chemical Corps
Materiel Comnd
Southern
Air
Materiel Area,
Europe 200 West Baltimore Street
Attn:
Quality
Control Office
Baltimore
1, Md.
APO
30,
New
York,
New
York
I
Attn:
Quality Assurance
Division
1
Commander
Air Materiel Force, Pacific Area Commanding General
Attn:
Quality
Control Office Chemical
Corps
Materiel Command
FEANCOM
Air
Base
200
West
Baltimore Street
APO
323
Baltimore 1, Maryland
San Francisco, California 1
Attnw
Quality
Evaluation
Branch
SCommander
Northern Air
M tere l Area, Pacific Commanding General
Attn: Quality Control
Office Ordnance, Amunition
Center
FEANCOM Air
Base Joliet,
Illinois
APO 323
Attn: ORDLY
AR.V
4
San
Francisco, California 1
Comanding
Officer
Comander Office
of Naval
Research
Southern Air
Materiel Area,
Pacific
Branch
Office
Attn: Quality Control Office
346
Broadway
Clark Air Force Base New
York 13,
New York
APO
74 Attn: Dr. J. Laderman
San
Francisco,
California
I
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Commanding
Officer
Commanding
Officer
Office
of
Naval
Research
S. C.
Supply
Agency
Branch Office
225
South
18th
Street
1000
Geary Street
Philadelphia
3,
Ph.
San Prancisco
9, California
1
Attn: Chief,
SIGSU-H6d
2
Commanding Officer
Commanding Officer
Diamond
Ordrance
Fuze Laboratories
U. S.
Naval
Underwater
Ordnance
Washington
25,
D. C.
Station
Attn:
Library, Room
211,
Newport,
Rhode
Island
Bldg.
92 1 Attrb:
Technical
Library
Office,
Chief
of
Engineers
Computation
Division
Attn: Procurement
Division,
Directorate
of
Managemnt
Military
Supply
Analysis
Dept. of
Army
I/Comptroller,
Hq. U.S. Air Force
Washington
25,
D. C.
2
Washington
25, D.
.
3
Commanding Officer
Detroit
Air
Pro-'tremenz D
strict
Diamond Ordnance
Fuze
aboratories
W.
Warren
Aven . Linyc Bl,,d.
Attn: Mr.
N.
S.
Leibmn
bttroit 32, Michigpn
Room
100,
Bldg.
52
Attn:
14OHDQPQ
Connecticut
Ave.
and Van
Ness St.
Washingten
25, D. C.
1
Director, Development
Division
Field
Comnd
Commanding
Officer
'med
Forces Special
Weapons
Naval
Awmnition and
Net Depot
Project
Seal
Beach,
California
Albuquerque, New
,.exico
Attn:
QE
Laboratory
(Technical
Library)
1
Engineering
Statir'Acs Group
Research
Division
Coanding
Officer
New York
University
Office
of Naval Resedrch
New York
53,
N. Y.
Branch Office
Navy No. 100
Field Inspectton
Section
Fleet Post Office
DES Division
New
York,
N.
Y.
2
Armed Services
Medical
Procurement
Agency
Comm ding
Officer
84
Sands Street
New York
Chemical Procurement
Brooklyn
1,
New York
I
District
180
Varick
Street
Head, Statistics
Branch
New
York
14,
F. Y.
Office
of
Naval Research
Attn:
Qu~lity
Surety Division
I
Washington
25, D.
C.
2
Quality
Assurance Section 1
Sperry
Gyroscope C:.
Commanding Officer
Great Neck,
New York
Rock Island
Arsenal
Attn:
Mr.
Herbert Jaffe, CP-25
L
Rock Island,
Illinois
Attn:
R D Division
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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-ix-
Eq.
Mobile
Air
Materiel
Area
office
of
Operations
AnalySis
Materiel
Quality
Division
(MOSQA)
DCS/Operationgs
Brookley
A.Lr
Force
Base
Hq.
Air
Proving
Ground
CoUmYnd
Alabama
Eglin
Air
Force
Base
Florida
Inspection
and
Quality
Control
Divisic.n
Office
of
Technical
Services
Office,
Assietant
Secretary
of
Department
of
Commerce
Defense
(S L,
Washington
25,
D.
C.
Washington
25,
D.
C.
Attn:
Mr. Irving
B.
Altman
1
Ordnance
Corps
Industrial Engineering Division
Inspection
an
Quality
Control
Disamond
Ordnance
Fuze
Leboratory
A
Division
Washington
25,
D.
C.
Office,
Assestant
Secretary
of
Defense
(S&L)
Qulity
Evaluation
Laboratory
-Washington
5,
D. C.
U.
S.
Naval Magazine
Attn:
Mr.
John
J.
Riordan
1
Port
Chicago,
California
Librarian
The
RAND
Corporation
Numerical
Analysis
Research
1700
Main
Street
University
of
California
Santa
14onica,
California
Los
Angeles
24,
California
Attn-
Library
Logibtics
Research
Project
Scranton
Ordnance
Plant
George
Washington
University
156
,.-dar
Avenue
707
22nd
Street,
N.
W.
Scranton,
Pa.
Washington
7,
D.
C.
IAttn:
Mr.
Carl
D. Larson
Wahno
7Chief
Inspector
52HN.A.
3
N .
t;tiattcal
Laboratory
\
-. 1512
S.
N -
.W.
Wes&"
-
n
25,
D.
C.
Univerity
of
California
Atthr:
Div.
of
Rezc?1-ch
Berkeley
4,
Calif'Olnia
Infowwt,-.
.
Tecnnical
Information
Officer
Naval
Inspector
of Ordnance
Naval
Research
Laboratory
Na .va Iecer
St rt
Washington
25, C. C.
6
/,'...',
00
S.
Bieger
Street
Mishawaka,
Indiana
SAttn:
N.
L.
Lindemmnn1
TchcaLiry
AOffice,
Assistant
Secretary
of
Naval
Inspector
of
Ordnance
Defense
(Research
& Dev.
50
West
Main
Street
Room
3 E
1065,
The
ps.ntagon
Rochester
4,
N.
Y.
1
Washington
25,
D
C.
Office
of
Naval
Research,
Code
200
Technical
Operation,
Tnc.
A
w
and
C.O..O.
Washington
25,
D.
C.
-..-..
Attn:
Mr.
John
D.
Wilkes
Hq.
Contnetal
1\rny
C'
.vIt-
.
F.-
Monrre,
Vlrg
in
i
a
.
-
8/11/2019 Factors for One Sided Tolerance Limits and Variables Sampling Plans
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Dr. Adam
Abruzzi
Mr.
Carlton
M. Beyer
Dept. of
Economics
of Engineering
Office
of
Ou-.ded Missiles
Stevens
Inst.
of Technology
Office, Asst.
Secretary
of
Hoboken,
New Jersey
1
Defense
(R & E)
Washington
25, D.C.
Prof.
Stephen
0. Allen
24
4
Laurel Street
Mr.
P.M. Blunk
San
Francisco,
California
I
Box
53 2
Fair
Oaks, California
Prof.
T. W.
Anderson
Center
for Advanced
Study
of
Mr.
Milton N.
Bradley
Behavioral Sciences
2481
Davidsozi
Avenue
Stanford,
California
1
New
York, N.Y.
Prof. Fred
C. Andrews
Prof.
Russell
Bradt
Mathematics
Dept.
Dept.
of Mathematics
University
of Nebraska
University
of
Kansas
Lincoln
8,
Nebraska
1 Lawrence,
Kansas
Prof.
Max
Astrachan
Prof.
Irving
W.
Burr
Institute
of
Technology,
USAF
Dept.
of Mathematics
Air
University
Purdue
University
Wright-Patterson
Air Force Base
Lafayette,
Indiana
Ohio
1
Prof.
A.
Charnies
Prof. Robert echhofer Statistical Laboratory
Dent. of
Mechanical
Engineering
Purdue
University
Cornell University
Lafayette,
Itiuiana
Ithaca,
N.Y.
Mr. Allen
Chop
Mr.
J. R.
Beck
162
-
8th
Street
Kodak
Processing
Laboratory
Oakland
7,
alifornia
925
Page Mill
Road
Palo Alto,
California
1
Prof.
Paul Clifford
New Jersey
State
Teachers
College
Professor
R. E. Beckwith
Montclaire,
New
Jersey
Statistical
Laboratory
Purdue
University
Prof.
Edward
P.
Coleman
Lafayette,
Indiana
1
Engineering
Department
University
of California
Prof. Maurice
H. Belz
Los
Angeles
24, California
University
of
Melbourne
Carlton
N.
3
Mr.
A.
F. Cone, Manager
Victoria, Australia
I
Quality
Assurance,
Dept. 551
Sandia Corporation
Prof. J. N.
Berrettoni
Albuquerque,
New
Mexi'o
Western
Reserve
University
Cleveland,
Ohio
I
Dr
Louts COuurt
Division
.'
N-t.nnal u.reau
o:
Stnl.ar
Wasnington
2 ., D.c'
..
?
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.-
Mrs.
J.
Henley Crosland
Mr.
Donald
Flischel
Director
of
Libraries
Attn:
MCRR
Georgia
Inst. of Technology
WA-ight-Patterson
Air
Force
Base,
Atlanta,
Ga.
Ohio
Dr.
Joseph Daly
Mr.
F.
Frishman
Bureau
of the Census
Research
and
Development
Dept.
Washington
25,
D.C.
1
U.
S.
Naval
Powder
Factory
Indianhead,
Maryland
Prof.
Georges Darmois
Director,
Institute
de Statistique
Mr.
Ora E. Gaines
11 Rue Pierre Curie
Hayes
Aircraft Corp.
Paris
5,
France P.O. Box 2287
c/o
Office of
Naval
Research Birmingham,
Alabama
London
Branch
Navy
No. 100,
Fleet Post
Office Mr.
S. Gaspar
New York,
N.Y.
I U.S.
N.O.T.S.
Pasadena
Annex
Prof.
Cyrus Derman
3202
E.
Foothill
Blvd.
Dept. of Industrial
Engineering
Pasadena
8, California
Col
umbia
University
New
York 27,
N.Y.
1
Mr.
Leoi Gilford,
ADSS
~ 5j~yikuan 1-2U.
S. Census Bureau
Mr. Sidney Dickman,
9-2
Wuahington 25,
D.C.
Sperry
Gyroscope Co.
Great Neck,
New
York
1
Mr. Bernard
P. Goldamith
.Qality ontrol Engineer
Mr. H.
F.
Dodge
Raytheon
Mfg. Co.
Bell
Telephone Labs.,
Inc.
55
Chapel
Street
463
West
Street
Newton 58,
Mass.
New
York, N.Y.
1
Prof.
Leo
A.
Goodan
Mr. B.F. Doetsch
Statistical
Research
Center
1519
Z. Fox Street
University
of
Chicago
South Bend
1s,
Indiana
1 1126
I. 59th
Street
Chicago
37, Illinois
Dr.
Francis
Dresch
Stanford Research
Institute
Prof. Eugene
L.
Grant
1915 University
Avenue
Civil
Engineering
Dept.
Palo
Alto,
California
1
Stanford
University
Stanford,
California
Prof.
Acheson J. Duncan
Dept.
of
Industrial
Engineering
Mr.
Geoffrey
Gregory
The
Johns Hopkins
University
4, Osboine
Grove
Baltimore 18,
Maryland
1
Gatley,
Cheadle
Cheshire,
England
Prof.
Meyer Dvass
c/o
Office
of Naval Research
Dept. of Mathematics
London Branch
Northwestern University
Navy No. 100,
Fleet Po3st 0:'f
e
Evanston,
Illinois
1
New Yorm,
N.Y.
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Prof.
P ank
M.
Oryna,
Jr.
Mr.
P
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Lindren
iQuality
Control
Consultant
Joy
Man,I'etu,
g
Company
Signal
Corps
ftgneering
Lab. -
*n
Street
ort
Monmouth,
ew
Jersey
i
C:remont,
New
ashire
Mr.
Douglass
Hawks,
Jr.
dminist*rative
Asgit.
Prof-
Sebastian
Littauer
ept.
of
Industrial
Engineering
American
Bosch
Arm
Corp.
Columbia
University
5555
So.
Archer
Avenue
New
York,
N.Y.
Chicago
38,
Illinois
Dr.
Leon
H.
rerbach
Dr.
Eugene
Lukacs
epartment
of
Mathematics
Dept.
of
Utnimts
Catholic
U.liversity
ew
York
University
Washington
17,
D.C.
ew
York
53,
N.Y.
.
1
Dr.
Clifford
J.
Maloney
Mr.
Walter
V.
Box"
Chief, Statistics Branch
ought
Aircraft,
Inc.
Allied
Sciences
Division
ull
as,
Texas
i
Camp
Detrick
Dr.
James
R.
Jackr-zn
Frederick,
Maryland
Management
Sciences
Research
Project
Prof.
a.
W.
Maclrath
65
Administration
Bld.
Dept.
of
canical
angneering
University
of
California
net
of
M
in
nesota
University
of
Minnesota
Los
Angeles
24,
California
i
Minneapolis
14,
Minn.
Mr
Brtnt
C.
J&cb,
Jr.
Dr.
Paul
Meyer
Chief
ndustrial
ngineer
Department
of
Mathematics
hrysler
Division-Chrysler
Corp.
Washington
State
College
2200
E.
Jefferson
Avenue
Detroit
14,
Michigan
Pulman,
Washington
Dean
Paul
z.
Mohn
r.
J.
P.
Kearney
School
of
Rngineering
uality
Control
Division
University
of
Buffalo
General
Services
Adm.
Buffalo,
N.
Y.
Room
6316
Region
3
Nldg.
Washington
25
D.C.
I
Mr.
Leo
9.
Morris
Prof.
oslo
K
uality
Evaluation
Laboratory
Mathematical
Institute
N.A.D.
Bangor
Faculty
of
Science
Bremerton,
Washington
Kyusyu
University
Dr.
R.
B.
Murphy
ukuoka,
Japan
c/o
Bell
Telephone
Labs.,
Inc.
Mr.
Howard
Laitin
463
West
St.
2134
Homecrest
Ave.
New
York
14,
N.Y.
Brooklyn
29,
N.Y.
Mr.
Monroe
Norden
Engineering
Statistical
Group
05
Tei
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ear
Research
Division
0-50
Thirtieth
Street
College
of
Engineertng
Long
:s Rnd
City,
New
York
I
New
York
University
401
West
205th
Street
r.
George
J.
Levenbach
New
York
34,
N.Y.
Bell
Telephone
Labs.
Marray
Hill,
New
Jersey
I
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Seymour Sherman
Dept. of Mathemwtics
Morc
Sehool of
Electrical
Eng.
Carnegie
Institute
of
Technology Unersity
of Pennsylvania
Pittsburgh,
Pa.
1
Philadelphia
, P.
Mr.
Cyril
Peckham
Mr.
Walter
Shewart
Project
Globe
Bell
Telephone
Labs.,
Inc.
University
of
Dayton
Mrray
Hill,
ew
Jersey
Dayton,
Ohio
1
Dr.
Pu
.Mr.
J.
Gordon
Siddons
SDr.
Paul
R.
Rider
aality
Control
Supervisor
Chief
Statistician
Boeing
Airplane
Company
Aeronautical
Research
Laborary
Seattle
i,
Washington
Wright
Air
Development
Center
Wright-Patterson Air Force Base
Dr. Rosedith
Sitgreaves
Ohio
1 Teachers College
Columbia
University
Dr. Harry G.
Romig New
York 27, N.Y.
351
Alma
Real
Drive
Pacific Palisades,
California
1
Dr. Milton
Sobel
Bell
Telephone
Labs.
Dr.
Alan J. Rowe
555
Union
Blvd.
General
Electric
Co.
Allentown,
Pa.
Production
Control
Service,
20Aea
570
Lexington
Avenue
rof.
Herbert Solomon
New York 22, N.Y.
1
Teachers
College
Columbia University
Prof. Herman Rubin
New
York
27,
N.Y.
Dept. of
Mthematics
University
of Oregon
Dr. M. D. Springer
Eugene,
Oregon
Head,
Statistical
Analysis Branch
PU.S.
Naval Ordnance Plant
Prof.
Norman
Rudy
Indianapolis,
Indiana,1
Statistics
Department
Sacramento
State College
Mr.
Selig Starr
Sacramento,
California
1 Research
& Development
Dept.
Pro-
U.S.
Naval
Powder Factory
Prof.
h-
nry Schieff
Indianhead,
Md.
Statistical
Laboratory
University of
California Mr.
Arthur
Stein
Berkeley
4,
California
1 Cornell
Aeronautical
Laborator4
Inc.
P.
0.
Box
235
Prof.
Robert
Schlaifer
Buffalo,
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Graduate
School
of
Business
Adm.
Harvard
University
Mr.
M.P. Straubel
Boston
63,
Ms. 1
Lear, Inc.
110
Ionia
Ave.,
N
W.
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R. H.
Shaw
Grand
Rapids
2,
Michigan
General
Dry
Batteries,
Inc.
13000
Athens Avenue
Mr. Dan Teichroew
Cleveland 7, hio
National Cash
Register
Co
Product Development
Dept.
14l)
E,
E
Segundo
Blvl.
Hawtorn~,
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