EU-PWI TF Task Force meeting, Cadarache 16-18 Oct. 2005 1 EU-PWI CONTRIBUTIONS FROM IFP F. Ghezzi Istituto di Fisica del Plasma, C.N.R., EUR/ENEA/CNR Ass.,

EU-PWI TF Task Force meeting, Cadarache 16-18 Oct. 2005

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EU-PWI CONTRIBUTIONS FROM IFP

F. GhezziIstituto di Fisica del Plasma, C.N.R.,

EUR/ENEA/CNR Ass., Milano, Italy


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CHARACTERISATION OF CARBON EROSION AND PROPERTIES OF PLASMA EXPOSED CARBON PFCs UNDER ITER RELEVANT

CONDITIONS

TW4-TPP-ERCAR

Deliverable n.1

STUDY OF SURFACE MORPHOLOGY MODIFICATIONS


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Objective

- Morphology of the Plasma Facing Component Exposed to High Dose (>1026 m-2).

- Erosion and Deposition Behavior


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Results from PISCES-B at high Fluence (October 2002, R. Doerner)


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Experiment

- Tile belongs to the toroidal belt limiter of TEXTOR

- Flux 3.7*1017 cm-2.s * 4.7 h Dose 6.26*1025 m-2


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Focusing on the Eroded Zone Sample Position

3 samples from the blade1 near the transition Erosion -Deposition dominated1 from the Deposition dominated1 as blank reference from the opposite surface

SEM Picture and EDSMicroanalysis on differentpoints for each sample

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1

4

2 3


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ResultsBlank Reference

Hillock Sand Blasting? Only Carbon and Oxygen


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Sample 1

- No Grass-like structures- Craters with no patterns- Localized sputtering (arcing?)

Mag 400X Mag 2500X

Average crater diameter 5 m


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EDS inside a crater EDS around a crater(white contour)

- Si from siliconization- Na, Cl and K surface Contaminants

-Cr, Fe and Ni re-deposited from the chamber- Al?


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PISCES-B TEXTOR

Tion = 50 eVTe = 6 eVTsample = 440 °C cost.

Exposure = 5000 sPyrolitic graphiteFluence = 8*1025/m2

Normal incidence

Tion = 200 eVTe = 40÷60 eVTsample = 200 °C cost.800 ÷1200 °C transientExposure = 16920 sIG 110 graphiteFluence = 6.26*1025/m2

Particle incidence?

Plasma and Sample Parameters Different

Key parameter for Grass-like structure?


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Sample 2

Sample 4

Sample 5

The Erosion Pattern disappear moving away from the blade


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EDS ANALYSIS ON MANY SPOTS FOR EACH SAMPLE

Divide the sample ideally in a top and bottom half

- SAMPLE 1,2 and 3: Fe, Cr, Ni, Si on the top half C and O only on the bottom half

- SAMPLE 4 and 5: C and O only on the top half Fe, Cr, Ni, Si on the bottom half

- Si always the main peak


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Summary

• NO “GRASS LIKE” STRUCTURE

• A COMPARISON BETWEEN TEXTOR AND PISCES-B IS NOT ADVISABLE

• SEM AND EDS CONFIRM THAT MOVING AWAY FROM THE BLADE IT CHANGES FROM EROSION TO DEPOSITION DOMINATED

• SI IS ALWAYS THE MAJOR IMPURITY


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CHARACTERISATION OF W AND CFC TARGETS EXPOSED TO ITER-RELEVANT

TYPE I ELM AND DISRUPTION

TW4-TPP-TARCAR

Deliverable 1 :Report on characterisation of EU targets before and after exposure to ITER-relevant Type I ELM and disruption loads in plasma-gun facilities.


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Objective

Type I ELM of 0.50-3 MJ/m2 significant damage of the divertor target. Single ELMs :energy fluxes over the sublimation (CFC) and melting threshold (W) by thermo-mechanical cycling of the material, for those ELMs which are under those thresholds. Disruption loads energy loads above the material damage.

Study the behaviour of the EU divertor targetcandidate materials under such loads


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15 targets (6 armoured with CFC NB31, 6 armoured with W-1%La2O3 and 3 with pure W) will be exposed to plasma-gun at the Russian research institute TRINITI

Experiment

1) Weighting (< 1 mg) before and after exposure, mass loss of the material .

2) Profilometry (better than 1m) of all the targets before and after exposure, profile and melt displacement (for W)

3) Optical and SEM microscopy, surface erosion pattern, crack formation, etc.


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4) Metalography and ceramography after exposure, thickness of damaged zone in CFC and of the molten and recrystalised layer for W. 5) SIMS, TEM, FIB, etc., will be applied to a subset of the samples if deemed necessary

STATUS: Targets are under exposure at TRINITI


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A MICROPLASMA JET AS ITER WALL DIAGNOSTIC

D Discharges in ITER will generate sufficient neutron activation to already impose remote handling for the First Wall First Wall modifications before to put D in ITER

RF Microplasma Jet Applications (OES):

- Coating

- Etching

- Film Deposition

- Selective Silicon Oxidation

- Synthesis of Carbon Nanostructure


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FILM DEPOSITION

Diagnostic for analyzing chemical reaction in chemical vapor deposition (Ba,Sr)TiO3

Thermal decomposition of the CVD source molecules Observed by OES (i.e. Calibration)

PLASMA PARAMETERS:

DC discharge 350 V 4 mA, Carrier Gas N2 Flow Rate 200 sccm


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INNER WALL MODIFICATION OF A PET CAPILLARY

Control the Flow in a Electro Osmosis in a Capillary Electrophoresis chip

Capillary ~ 500 mm r

Quartz Tube 1 or 2 mm r

PLASMA PARAMETERS:

RF Discharge 13.56 MHz (commercial), Gas carrier He, Ar, O2 Flow Rate 100 ÷ 200 sccm Power 3 ÷ 10 W


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RF DISCHARGE FOR SI ETCHINGCapillary W or SS ø 1mm x 20 mm L

PLASMA PARAMETERS: RF Discharge 13.56 MHz, Gas Carrier Ar, He, CF4, Power ~ 70 W, Flow Rate ~ 70 sccm


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ADVANTAGES:

- Miniaturization of the plasma volume

- Ultra high density 1013 ÷ 1017 cm-3

- Carrier Gas Pressure 20 mbar ÷ 1 atm

- Small eroded quantity on the surface for analysis

- High spatial resolution ~ 100 m

- Ease to realize a miniaturized total chemical

analysis system (vs Raman)

DISADVANTAGES:

Can observe only ionized and excited species

Fragile ( Capillary material)


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SPECIES TO BE DETECTED

H2, D2, T2, CXn, C, W, Be, Ar, O2, Ne, N2

ONLY TO RESOLVE H2 FROM D2 HIGH RESOLUTION OES


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ANALYSIS OF ION AND EXCITED BY OESANALYSIS OF NEUTRAL BY QMS DISCHARGE AND ANALYSIS FROM 20 mbar to 1 atmCALIBRATION OF OES SENSITIVITY BY QMS

BUDGET FORECAST TOTAL 233.9 k€


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ANNUAL MANPOWER (in PPY and TPY)

CATEGORIES Tariff 2006 2007 2008 Total

Professionals (PPY) 120 kEuro/PPY 98 98

Technicians (TPY) 95 kEuro/TPY 25.9 25.9

Total 0 0 0 123.9

ANNUAL EXPENDITURE (in kEuro)

CATEGORIES 2006 2007 2008 Total SupportOnly basic/Preferential

Personnel 123.9 Only basic

Missions 3 Only basic

Capital investment 110 Preferential

Other expenditure 2 0 Instruments costamortizment (180 d

100%)

1) Sub-Total at 20%Support

(1)

EU-PWI TF Task Force meeting, Cadarache 16-18 Oct. 2005 1 EU-PWI CONTRIBUTIONS FROM IFP F. Ghezzi Istituto di Fisica del Plasma, C.N.R., EUR/ENEA/CNR Ass.,

Documents

eupwi tf task force

eupwi contributions

blade slide

triniti slide

doerner slide

oxygen slide

characterisation of

half sample